Maury MW - Calibrated Noise Sources - NC3600 Series
- High ENR
- Wide frequency range
- Custom frequencies available
The NC3600 Series coaxial noise sources are an excellent choice for applications requiring high ENR, such as ATE, radiometer, and radar systems.
An SMA male connector is standard for the RF output and feed thrus for bias input. SMA female is an option. Custom frequencies and flatness available. Contact the factory with your request.
|
Standard Input Voltage |
Typical Current |
Callibration |
|---|---|---|
|
+15V |
100 mA | Every 1 GHz |
More Product Information
- S-parameters comparison of user-characterized and factory-characterized verification standards
- S-parameters comparison of user-characterized and factory-characterized verification standards with measurement uncertainty boundaries
- Includes beaded airline, mismatch airline, offset shorts and fixed loads
- AWGN as high as +13 dBm
- Bandwidths up to 18 GHz
- Bandwidth, output power, and flatness can be modified for specific applications
- TTL controlled attenuation
The NC1000 Series amplified noise modules produce AWGN as high as +13 dBm, and have bandwidths up to 18 GHz. The high power modules are designed to test noise immunity for Cable TV equipment, secure communication channels, and military jamming systems. The lower power modules, <= 0 dBm, are random jitter sources for many applications including, PCIexpress, Infiniband, and 10 GigE. The Bandwidth, output power, and flatness can be modified for specific applications. A newly developed TTL controlled attenuation feature is also available.
EMC test equipment to evaluate the resistibility of electronic devices and components when energy charged on a human body or object is discharged to the electronic devices and components. NoiseKen brand ESD simulator is available to see malfunctions or function declines of electronic equipment for appropriate evaluations compliant with IEC 61000-4-2 Ed.2 Test Standard, ISO 10605 Ed.2 Test Standard & ISO 10605 Ed.3 Test Standard.
The ESS-S3011A features a function which enables the user to pre-program test settings to minimize setup errors as well as having the unit be incorporated into a remote or autonomous testing setup. Another feature that sets apart NoiseKen ESD guns to that of competitors is the discharging gun separation design which helps achieve the lightweight.
For conventional ESD guns, that have generators that are inseparable from the gun, you may experience having to replace the whole unit even only when certain parts of the unit are broken. However, with the NoiseKen’s separation design, replacement parts can be minimized to lower the running cost.
- High Power Density: Up to 15 kW in 3U, 30 kW in a 6U chassis
- Wide Voltage Range: 0-10V up to 0-1000V, from 4 to 30 kW
- Fast Load Transient Response: Protection from undesired voltage excursions
- Low Ripple and Noise
- Intuitive Touch Screen Display
- Parallelable up to 150 kW
- Sequencing: Free system controller & speed up test
- Low audible noise: Temperature controlled variable speed fans
- High power density / low ripple and noise
- High programming resolution with Ethernet interface
- Constant voltage and current mode
- Remote sensing
- Isolated analog control and monitoring (optional)
- 1 - 6 GHz, 40dB Gain, 2.5dB N.F.
- Compensation long cable loss for EMI Measurement
- Improve system noise floor flatness
- High EMI performance
- High linearity LNA for EMI measurement
- High dynamic range
- Unconditionally Stable
- State-of-the-Art Technology
- Output White Gaussian noise
- Output power up to +30 dBm
- 127 dB of attenuation; 0.1 dB step size
- Units > 2 GHz have total attenuation of 79.9 dB
- Low distortion signal path
- Power 115 VAC, 60 Hz
- Noise attenuator accuracy: ±0.2 dB or 0.5% at 1 – 500 MHz ±0.2 dB or 1% at 0.5 – 1.0 GHz ±0.3 dB or 2% at 1 – 2 GHz
- Standard connectors SMA female
- 7” touch screen display
- Dimensions: 17.25 in. wide x 6.50 in. including feet, high x 19.50 in. deep
- Removable hard drive for added security
- Operating Temperature: -10° to +65°C
- Single or dual-channel display
- Agilent HP 437 & Agilent HP 438, and Boonton 4220A & 4230A emulation
- Automatically loads sensor data
- Simple software control via SCPI language
- IEEE-488 and RS-232 interfaces standard
The 4240 series of CW RF power meters provides the high speed measurement capability needed in a production environment, as well as the simplicity of operation required for bench top use. It provides very accurate measurements from -70 dBm to +44 dBm (sensor dependent) and has a rapid display update rate for tuning applications. The easy to read LCD displays both channels simultaneously with numeric and bar graph information.
- Directly compatible with most commercial VNA’s
- Available as polynomial and characterized device kits
- Measure S-Parameters with uncertainty when used in conjunction with Maury’s Insight software platform
Maury offers coaxial and waveguide VNA calibration kits.
Coaxial calibration kits are offered in Polynomial SOLT, Characterized Device (CD) SOLT, and TRL, depending on the connector series. Where available, CD kits improve calibration accuracy when compared to SOLT kits based on polynomial definitions as each calibration kit is provided with individually characterized short, open and fixed load standards, whose S-parameters can be loaded into commercial VNAs directly or when used with Maury’s Insight™ software platform. When combined with Insight™, users will be able to quantify the uncertainty contribution of their calibration kit to their overall measurements. CD cal kits result in TRL-like accuracy with fixed-load SOLT ease-of-use.
Maury Microwave
Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.