Maury MW - VNA Calibration Standard - Short Circuit Termination Series
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Fixed flush and fixed offset short circuit terminations (shorts) are used to establish reference planes in transmission systems and as key elements in the calibration of vector network analyzers (VNAs). Offset shorts can be used for banded calibrations of VNA. Those with the longest offset are often used to evaluate the calibration effectiveness of a VNA by measuring the effective source match after calibration.
|
Frequency Range (Coaxial) |
Frequency Range (Waveguide) |
Reflection Coefficient |
|---|---|---|
|
DC to 67 GHz |
2.6 to 50 GHz | 0.98 to 0.995 |
More Product Information
The overall performance of a power meter dependents on the power sensor employed. Maury has a variety of quality power sensors to meet virtually all applications. Maury has a complete line of Peak and Average power sensors up to 40 GHz for all of your fast rise time, wide bandwidth and wide dynamic range applications. In this document, browse through our large variety of advanced sensor solutions.
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Maury mismatch airlines have been designed as verification standards to be used in VNA calibration validation. Each mismatch airline is provided with factory S-parameters data that can be compared with user-measured S-parameters for VNA calibration validation. Measurement uncertainty is also provided, and uncertainty boundaries can be used for definitive calibration validation when used in conjunction with MT940B Insight Real-Time Uncertainty Add-On.
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
A precision fixed termination (or load) consists of an immovable, (fixed) termination which, when mated to the end of a trans-mission line or cable, absorbs nearly all of the signal energy traveling toward it. An ideal “matched” condition exists when a termination with an impedance value of Z0, is connected to the end of a transmission line or cable that also has a characteristic impedance of Z0. Such an ideal “matched” condition (one with no mismatch between the termination and its mated line or cable) is critical if a voltage standing wave ratio (VSWR) of 1.0:1 is to be achieved in a system with a 50 or 75 ohm impedance value. Simply put, the more closely the 1.0:1 ratio is approached, the more accurate the measurements that can be made from a system.
Junkosha’s new mmWave VNA Test Cable Assembly exhibits excellent phase (within +/- 4.5˚ at 50 GHz), and amplitude (within +/- 0.08 dB at 50 GHz) stability in flexure alongside strong phase stability in temperature through its 50 GHz bandwidth, available with NMD connector.
The assembly also displays impressive performance durability, surpassing 40,000 tick tock cycles during testing. The cable is bent 180˚ on a 2.25” radius mandrel with ease, demonstrating superior flexibility and no spring back. A ruggedized port side NMD connector is also available to ensure reliable connections to the VNA.
- 600 MHz of instantaneous bandwidth per channel
- Timing synchronization up to 16 channels
- Link Emulation including:
- Phase continuous delay, Doppler, and attenuation changes
- AWGN and Eb/No
- 12 tap (path) multipath fading with Rayleigh, Rician & CW. Angle of Arrival (AOA), k-factor, and correlation controls
- RF frequency agile up/down converters
- Payload Emulation including:
- IMUX/OMUX amplitude and group delay distortion
- Amplifier Compression (AM/AM and AM/PM)
- Phase Noise
- Static and dynamic link emulation
- Ephemeris data generation using SATGEN
- Remote instrument control through ACEClient application
Not all amplifiers are created equal, so how can you be certain that an amplifier will work for your needs? You deserve to be confident that the amplifiers used with your test-and measurement lab benches will meet the requirements of your specific applications, are reliable, and are equally well-supported pre-and post-sale. When it comes to application expertise, reliability and support, there is no company that does it better than Maury.
- S-parameters comparison of user-characterized and factory-characterized verification standards
- S-parameters comparison of user-characterized and factory-characterized verification standards with measurement uncertainty boundaries
- Includes beaded airline, mismatch airline, offset shorts and fixed loads
The VectorStar ME7838x4 broadband system VNA offers the widest available 4-port single sweep measurements from 70 kHz to 110, 125, 145, and 150 GHz with mmWave bands up to 1.1 THz
- The ME7838E4X 4-port system sweeps from 70 kHz to 110 GHz (Guaranteed specifications)
- The ME7838A4X 4-port system sweeps from 70 kHz to 125 GHz (Guaranteed specifications)
- The ME7838D4 4-port system sweeps from 70 kHz to 145/150 GHz
- The ME7838G4 4-port system sweeps from 70 kHz to 220 GHz
- All systems may be configured to include banded millimeter-wave modules up to 1.1 THz
- Industry-best calibration and measurement stability: 0.1 dB vs 0.6 dB over 24 hrs
- All systems also supports the 3744x-Rx receiver for noise figure measurements to 125 GHz
- Compact, lightweight mmWave modules offer low cost installation with industry-best performance
Bank of fixed resistance, capacitance and inductance standards with defined frequency characteristic up to 1 MHz for automated calibration of LCR meters.
- Automated RCL calibration
- Calibration data from 20 Hz to 1 MHz
- No need for pen and paper method
Maury Microwave
Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.