Maury MW - VNA Calibration Standard - Short Circuit Termination Series
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Fixed flush and fixed offset short circuit terminations (shorts) are used to establish reference planes in transmission systems and as key elements in the calibration of vector network analyzers (VNAs). Offset shorts can be used for banded calibrations of VNA. Those with the longest offset are often used to evaluate the calibration effectiveness of a VNA by measuring the effective source match after calibration.
|
Frequency Range (Coaxial) |
Frequency Range (Waveguide) |
Reflection Coefficient |
|---|---|---|
|
DC to 67 GHz |
2.6 to 50 GHz | 0.98 to 0.995 |
More Product Information
VNA Master (500 kHz to 4 GHz)
- 2-port, 1-path Vector Network Analyzer (VNA) Intuitive Graphical User Interface (GUI) with resistive TFT Touch Screen
- Exceptional RF immunity
- 100 dB Transmission Dynamic Range Vector
- Voltmeter option, ideal for cable phase matching
+Spectrum Analyzer (9 kHz to 4 GHz)
- Dynamic Range: > 95 dB in 10 Hz RBW
- DANL: –162 dBm (1 Hz)
- Phase Noise: –100 dBc/Hz max @ 10 kHz offset at 1 GHz
- Frequency Accuracy: < ±50 ppb with GPS On
- Detectors: Peak, Negative, Sample, Quasi-peak, and true RMS
- PIM Hunting
- Standard three-year warranty (battery one-year warranty)
- S-parameters comparison of user-characterized and factory-characterized verification standards
- S-parameters comparison of user-characterized and factory-characterized verification standards with measurement uncertainty boundaries
- Includes beaded airline, mismatch airline, offset shorts and fixed loads
- Speed: Calibration is faster since there is no need to manually connect and disconnect standards.
- Accuracy: Eliminates errors caused by manual handling, such as connector inconsistencies and improper torquing.
- Ease of Use: Minimal user interaction is required, making calibration simpler and more accessible.
- Reliability: Reduces wear and tear on VNA ports and connectors, prolonging their lifespan.
- Consistency: Provides repeatable results across multiple calibration sessions and users.
20 ppm calibrator of DC process signals designed for calibration of evaluation units and process multimeters under demanding industrial conditions. Includes RTD and resistance source.
- 20 ppm accuracy
- 13°C - 33°C reference temp. range
- 100 V @ 25 mA output capacity
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
A precision fixed termination (or load) consists of an immovable, (fixed) termination which, when mated to the end of a trans-mission line or cable, absorbs nearly all of the signal energy traveling toward it. An ideal “matched” condition exists when a termination with an impedance value of Z0, is connected to the end of a transmission line or cable that also has a characteristic impedance of Z0. Such an ideal “matched” condition (one with no mismatch between the termination and its mated line or cable) is critical if a voltage standing wave ratio (VSWR) of 1.0:1 is to be achieved in a system with a 50 or 75 ohm impedance value. Simply put, the more closely the 1.0:1 ratio is approached, the more accurate the measurements that can be made from a system.
- Guaranteed performance to 43.5 GHz with Extended K™ ports
- High output power allows measurement of high attenuation devices
- Advanced time domain option provides tools for signal integrity analysis
- Wide dynamic range enables measurement of very low reflection artifacts
- Excellent corrected directivity minimizes measurement uncertainty
- SmartCal™ auto calibration unit reduces calibration and setup time
- Time domain with time gating option grants easier and faster fault identification
- Modern LAN interface for remote control is faster than GPIB
- A common GUI and SCPI interface within the ShockLine family
- Bias tee option simplifies test setups where the DUT needs DC biasing
- Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction
- E-Band VNA
- Extended frequency range covering E-band and major parts of V band
- Fully assembled test system eliminates setup errors and increases reliability
- Tethered modules connect directly to the DUT increasing measurement stability
- Ideal probe for up to 48 V power conversion
- 250, 500 MHz and 1 GHz bandwidth
- 80 V dynamic range
- 60 V common mode
- Highest accuracy
- 0.5% gain accuracy
- Precision gain calibration
- Best LF flatness (0.1 dB)
- Lowest noise and highest rejection
- Wide variety of tips
- High performance solder-in
- Browser
- Single pins and header
- Mini and micro grabbers
- Socketed connections
- High temp solder-in
- Y-banana adaptor
- ProBus active probe interface
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Maury mismatch airlines have been designed as verification standards to be used in VNA calibration validation. Each mismatch airline is provided with factory S-parameters data that can be compared with user-measured S-parameters for VNA calibration validation. Measurement uncertainty is also provided, and uncertainty boundaries can be used for definitive calibration validation when used in conjunction with MT940B Insight Real-Time Uncertainty Add-On.
High resistance decade with built-in test signal meter for calibration of high resistance meters up to 6 kV. Based on M6xx Real-Resistance decade series with short function for short current testing.
- 10 kΩ - 100.0 GΩ, short function
- Hot-switching up to 6 kVdc limit
- Test voltage and current indication
Maury Microwave
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Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.
