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Teledyne LeCroy - T3AWG2K Series 16-bit Dual Channel Arbitrary Waveform Generator
- 150 MHz, 2 analog channels
- 8 synchronized digital channels (T3AWG2152-D only)
- 16-bit vertical resolution
- 128 MPts @Ch waveform memory
- Max sampling rate of 600 MS/s
An affordable yet high performance solution for all AFG and AWG functions, specializing in key applications such as Automotive Ethernet Transmitter Distortion Test and Double Pulse Testing. The 8 synchronized digital channels (T3AWG2152-D only) are ideal for digital design debugging and validation.
The T3AWG2K series consists of two affordable dual-channel arbitrary waveform generators, 16-bit vertical resolution, 6 Vpp output voltage (50Ω to 50Ω), 128 Mpts/ch memory, a maximum sampling rate of 600 MS/s and a maximum sine wave frequency of 150 MHz. The T3AWG2152-D mainframe adds 8 synchronized digital channels to the analog outputs, ideal for debugging and digital design validation.
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Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing |
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Arbitrary/Function Generator,2 Ch,8-DIG ch, 150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing |
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More Product Information
- Static power analysis - like a dedicated power analyzer
- Dynamic power analysis – capture more information
- Complete test coverage – control system, power section, motor
- Comprehensive mechanical interface
- Harmonics calculation option
- Vector display option (THREEPHASEVECTOR)
- Waveform Transformations option (THREEPHASEdq0)
- 16 Channels with OscilloSYNC™
- Uses standard PC Ethernet port & hardware
- Supports cable lengths up to 100 m (CAT-5e or CAT-6)
- Simplified set-up with field proven Sapera LT software featuring CamExpert
- Engineered to accommodate industrial environment with a ruggedized screw mount RJ-45 connector
- Vector Network Analyzer Frequency Range from 10 MHz up to 3.2 GHz
- Spectrum Analyzer Frequency Range from 9 kHz up to 3.2 GHz
- -156 dBm/Hz Displayed Average Noise Level (Typ.)
- -98 dBc/Hz @10 kHz Offset Phase Noise (1 GHz, Typ.)
- Total Amplitude Accuracy < 1.2 dB
- 1 Hz Minimum Resolution Bandwidth (RBW)
- All-Digital IF Technology
- Standard Preamplifier
- Distance to fault capability using VNA time domain analysis
- Up to 1.5 GHz Tracking Generator Kit
- Built-in Advanced Measurement capability (CHP, ACPR, OBW, CNR, TOI, etc)
- 10.1 lnch WVGA (1024 x 600) Display
- 500 MHz - 4 GHz bandwidths
- Up to 40 GS/s sample rate
- 15.4” capacitive touch screen
- MAUI with OneTouch
- Powerful, Deep Toolbox
- Exceptional Serial Data Tools
- 16 digital channels with 1.25 GS/s
- Huge Applied Offset Range
- Optional Application Packages
High voltage differential probes provide high CMRR over a broad frequency range (up to 400 MHz) to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.
WaveMaster 8000HD is the only high speed oscilloscope designed for all stages of product development, whether first-silicon characterization, link validation over channels, or debugging across the entire the protocol stack. No other high speed oscilloscope supports more engineering tasks with more unique tools.
- Exceptional signal characterization performance
- Unrivaled validation and debug capabilities
- Comprehensive serial data expertise
With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.
- S-parameters DC to 40 GHz, single-ended and mixed-mode
- Impedance Profile with <1 mm resolution, differential and common mode
- Built-in automatic calibration, no manual setup required
- TDR-powered impedance profiling enables precise de-embedding
- Advanced de-embedding including Time Gating and 2Xthru
- Emulate eye diagrams with equalization and advanced jitter analysis
- Complete NRZ and PAM analysis suite for high-speed serial data
- All-in-one solution for testing, compliance, and diagnostics.
AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.
Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.
From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.
Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.
Teledyne LeCroy
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