• Supports PCI Express Rev 2.0 x4 or higher, backwards compatible with PCIe Rev 1.10 slots 
• Up to 512MB of high-speed image memory 
• Single slot solution with reconfigurable camera control and general purpose input/outputs

Linea Lite makes line scan more accessible than ever. Designed with performance in mind, this camera offers superior color fidelity with 2k to 4k resolution and line rates from 12.5 to 50 kHz, with a GigE Vision® interface.

Linea line scan cameras deliver the performance and features usually found in high-end cameras at an attractive price point. Based on advanced CMOS line scan technology, Linea GigE cameras have a 2k or 4k single line 7.04 µm x 7.04 µm pixel array. With excellent sensitivity and speed, Linea surpasses the requirements of demanding applications —such as materials grading and inspection, transportation safety, and general purpose machine vision.

Probe adapters provide simple and easy interface of third-party probes as well as change between the different Teledyne LeCroy Oscilloscope input and cable types (ProBus, ProLink, K/2.92 mm, BNC and SMA). Depending on the adapters, changing between the Teledyne LeCroy Oscilloscope's input type may have an effect on the overall performance of the channel.

• Four operating modes: – CC, CV, CR, CP.
• Static, Dynamic and Sequence mode support.
• Built in Application Functions - Short Circuit Test, Battery Test Mode, CR-LED Mode, OCP and OPP Test.
• Provides a load of up to 300 Watts.
• Programmable and analog external control.

• 2000 Vrms input
• 6000 Vpeak transients
• Up to 500 MHz bandwidth
• Ideal for Surge/EFT testing

High voltage single-ended passive probes are suitable for a wide range of applications where ground-referenced high-voltage measurements must be made safely and accurately. There is also a sense pin to automatically configure the oscilloscope for use with the probe.

AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

• Up to 65 GHz 
• Up to 80 Channels @ 36 GHz 
• Up to 160 GS/s 
• Up to 512 Mpts/Ch 
• 50 fs rms Sample Clock (Intrinsic) Jitter 
• Jitter Between All Channels of <130 fs rms

• 100 MHz, 200 MHz, 350 MHz, 500 MHz and 1 GHz bandwidths 
• Up to 4 GS/s sample rate 
• Long Memory – up to 20 Mpts 
• 10.1” capacitive touch screen display 
• 16 Digital Channel MSO option 
• MAUI - Most Advanced User Interface 
  • Designed for Touch 
  • Built for Simplicity 
  • Made to Solve 
• Advanced Anomaly Detection 
  • Fast Waveform Update 
  • History Mode - Waveform Playback 
  • WaveScan - Search and Find 
• Multi-Instrument Capabilities 
  • Protocol Analysis - Serial Trigger and Decode 
  • Waveform Generation - Built-in Function Generator 
  • Digital Voltmeter and Frequency Counter 
• Future Proof 
  • Upgradeable Bandwidth 
  • Field Upgradable Software and Hardware Options