Companies manufacturing all sorts of products use Quality assurance (QA) to prevent errors and mistakes in their products and ensure flawless product deliveries to their customers. This willimprovecustomer satisfaction and reducethe need for after-salestroubleshooting and support.

QA give companies get a systematic process to find outif their products meet what is required. QA defines requirements for developing and manufacturing reliable products.A driving force behind QA is the ISO(International Organization for Standardization). ISOhas developed the ISO 9000international standard, on which many companies base their QA system.

QA testing is done during and after development andprovidesinformationtodevelopers if changes or improvements are required.During product development the development team will do thorough testing of the product, covering e.g. functional and stress testing of the basic functionality of the product. QA testing of physical products normally includes stress testing of a number of environmental conditions.QA tests that may be conducted include:

• EMC Tests •Mechanical Tests
• Thermal/Humidity Tests
• Hi-Pot Tests
• Sand and Dust Tests
• Salt Spray Tests

Time: 11 AM Pacific | 2 PM Eastern

Duration: 60 minutes including Q&A

Cable flexibility is important for stable measurement and wiring efficiency between the measuring equipment and device under test. Junkosha provides flexible and low resilience coaxial cables which improve workability with complex wiring and reduces the risk of damage to the instruments and DUT.

Join Teledyne LeCroy for this hands-on webinar to learn how to characterize and validate the integrity of multiple power rails in a PDN network. The interactions and control of VRM’s, POL’s, LDO’s by Power Management ICs in embedded designs will be analyzed in this webinar.

Topics to be covered in this webinar:

• Best practices for power rail probing
• Multi-rail static and transient power analysis
• Validation of start-up and shutdown delays and sequences
• Correlation of embedded serial control signals - I2C, SMBus, PMBus, and SPMI - to power management events

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

MAUI Studio
>> https://teledynelecroy.com/mauistudio/

Zip file with Lab Notebook files
>> Click here to download the zip file

These files will allow you to load the various waveform examples shown during the webinar and participate in hands-on instruction on how to make critical power integrity measurements.

The workhorse instrument used to characterize all PCB traces is the Time Domain Reflectometer (TDR). But its measurements are often mis-interpreted because the impedance properties of transmission lines are confusing.

Join Eric Bogatin and Teledyne LeCroy for this webinar that will show you the right way to think about signals on transmission lines and how to interpret TDR results. Using live measurements, we’ll look at some cool examples of the properties of real circuit board traces.

Topics to be covered in this webinar:

• What is characteristic and instantaneous impedance?
• How a TDR measures instantaneous impedance
• How to read the characteristic impedance off the front screen of a TDR
• How to interpret discontinuities
• The limitations to a single channel TDR

Who should attend? Any engineer who uses a TDR or uses TDR measurements.

What attendees will learn? How to get the most value from TDR measurements to analyze your interconnects.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

Enhanced Sample Rate, combined with the low-noise system architecture and the tailored brick-wall frequency response in the HDO4000A, HDO6000A, HDO8000A and MDA800A series oscilloscopes dramatically improves the measurement precision when the input frequency signals are very high frequency, such as a high-frequency sine wave or fast edge.

We explore in detail the relationship between discrete-frequency responses connected with sparameters and the implied continuous time response. This is done in both the frequency- and time-domain to develop the proper insight and explore issues with real time-domain responses, time-aliasing, causality, interpolation and re-sampling of discrete-frequency data. Using the insight gained, we identify the conditions for sufficiency of sampling and the side-effects of the invariable practical conditions when these side-effects cannot be completely dispelled. This paper is especially useful for understanding issues involved in direct application of sparameters in linear simulations, like those used in virtual probing applications in scopes.

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Fundamentals of Power Integrity

In this session (Part 1), we will define what power integrity is and why should we care. We will review the types of power distribution network (PDN) noise, including self-aggression noise, pollution of the board/package interconnects and mutual aggressors and conclude with best measurement practices.

Topics to be covered in this webinar:

• Basic definitions
• Tolerances and why they matter
• PDN noise types
• Best measurement practices
• Real-world probing examples

Who should attend? Hardware design and validation engineers and technicians interested in learning more about PDN noise and power integrity problems and solutions.

What attendees will learn? Attendees will be given a thorough background in power integrity and how to assess it in a design.

Presenter: Dr. Patrick Connally, Product Marketing Manager

The digital oscilloscope has become the most commonly used test tool on the EMC engineer’s bench, but most engineers use only a fraction of the power available in these instruments. In addition, there are several overlooked aspect s which can significantly impact signal integrity and EMC measurement results.

Join us for this webinar as we uncover oscilloscope tools that can assist with advanced and more accurate methods for performing EMC testing.

Measurements included in our discussion will be:

• EMC Measurement Categories and Requirements
• Conducted Immunity Testing Requirements and Pulse Measurement Definitions
• ESD Threshold Selection
• Level-After-Pulse, Time-To-Value, and Parameter Limiters
• ESD Verification and Test Setup
• ISO10605:2008 Consecutive Parameter Trending
• Sample Rate and Dynamic Range Impact on ESD Pulse Measurements
• Much more!

Presenter: Mike Hertz, Teledyne LeCroy Sr. Field Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

In this webinar, Eric Bogatin will show three important measurement techniques to characterize the VRM properties and noise, and the role that bulk capacitors and ferrite filters play in reducing noise on the power rails.

Click here for details & registration

USB Type-C® Technologies Webinar Series

Join Teledyne LeCroy for our webinar series on USB Type-C technologies with a focus on the physical layer, from an introduction to the various technologies in the Type-C ecosystem to USB 3.2, USB4™, Thunderbolt™, DisplayPort™, USB4 Type-C sideband (USB Power Delivery, DisplayPort AUX, USB4 SB) testing.

USB Type-C Sideband Physical Layer Testing

In Part 4, we will focus on compliance and interoperability (C&I) of USB Type-C connected hosts, hubs, adapters, and peripherals. Designers are challenged to meet all USB-IF, VESA, and Thunderbolt Specifications. This webinar will explore practical approaches to debugging electrical system issues that may occur when connecting USB-C devices together.

Topics to be covered in this webinar:

Presenter: Thomas Stüber

Looking for background knowledge for Automotive Ethernet, who uses it, why they are using it, and what to expect when testing it? This webinar is for you.

Register here

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Accurate and Efficient PDN Measurements Learning Lab

In this session (Part 2), we’ll demonstrate and teach how to make accurate, high bandwidth measurements of power rail voltages and avoid introducing probing artifacts or interference into the measurements.

Topics to be covered in this webinar:

Join Teledyne LeCroy for this hands-on webinar to learn how to make accurate, high bandwidth measurements of power rail voltages and avoid introducing probing artifacts or interference into the measurements.

Topics to be covered in this webinar:

• Best practices for power rail probing
• Probing tradeoffs: Noise, reflections, offset, bandwidth, loading
• Power rail static and transient analysis
• Correlating power rail noise to clock jitter
• Using spectral analysis to finding root causes of PDN noise

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

MAUI Studio
>> https://teledynelecroy.com/mauistudio/

Zip file with Lab Notebook files
>> Click here to download zip file

These files will allow you to load the various waveform examples shown during the webinar and participate in hands-on instruction on how to make critical power integrity measurements.

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

We didn’t expect to have DC outputs be so noisy! Is it really the circuit that is a problem or is our scope and/or probe causing signal integrity issues? We even tried changing output capacitors to improve the performance, but why are we seeing 2X greater output noise than we expected?

In this session we review which probes are best for your application and how best to connect to your oscilloscope to minimize RF pick up.

Topics to be included:

Join Teledyne LeCroy as we describe and demonstrate best practices for de-embedding test fixtures, cables, and probes from serial data link and other signal integrity measurements. This is a critically important process to ensure that the signal integrity measurements for the DUT are not contaminated by the interconnection elements.

Topics to be covered in this webinar:

• Why de-embedding is almost always necessary
• Best practices for reference-plane calibration
• Traditional Frequency-domain de-embedding
• Time-domain gating and peeling (i.e. fixture removal, in-situ de-embedding (ISD))
• Causality conditions

Who should attend? Hardware engineers who use a Vector Network Analyzer (VNA) to obtain S-parameters for use in emulation software.

What attendees will learn? How to accurately measure S-parameters of high-speed interconnects.

Presenter: Prof. Eric Bogatin

Join Professor Eric Bogatin as he discusses and demonstrates how to measure in-circuit jitter caused by PDN power integrity noise and other abnormalities.

Register Here

A single-polarization 160-Gb/s (80-Gbaud) electronically time-division-multiplexed (ETDM) quadrature phase-shift-keyed (QPSK) signal is generated and coherently detected using two 45-GHz-bandwidth oscilloscope prototypes and offline processing.

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

Using TDR Technology to Debug and Solve Signal Integrity Impairments Join Teledyne LeCroy to learn how to measure and analyze impedance on cables, connectors and PCBs using TDR (Time Domain Reflectometry) instruments.

Topics to be included:

• TDR Basics
• Rise Time of the TDR-Pulse vs Resolution
• Why we use filtered impedance curves
• How to convert the impedance plot into distance
• What additional information provides the frequency range?
• How to probe PCBs using TDR probes

Who should attend? Engineers dealing with high-speed data signals who want to identify and evaluate the effect of impedance changes in cables, connectors and printed circuit boards.

What attendees will learn? To learn how to measure and analyze impedance on cables, connectors and PCBs using TDR.

Presenter: Thomas Stueber, Group Leader Applications, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

Have you ever had a device which passed compliance but did not establish a communication link between Master and Slave? Join Teledyne LeCroy for this webinar as we explore some of the different approaches for debugging Automotive Ethernet links by looking at both the physical and protocol layers.

Who should attend: Engineers and technicians who have worked on or will work on Automotive Ethernet. This session will start with the basics and build on them to cover debugging techniques.

What attendees learn: A working knowledge of how Automotive Ethernet frames compare to standard Ethernet frames, how the link startup sequence works, and how to debug Automotive Ethernet links.

Presenter: Bob Mart, Director of Product Management, Teledyne LeCroy

Register now

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

We experimentally demonstrate 8 dB of mode-equalized distributed Raman gain using a backward pumping scheme. The equivalent noise figure of the amplifier is -1.5 dB, and the amplifier was successfully employed to demonstrate 6-channel mode-multiplexed MIMO transmission over 137-km few-mode fiber.

Join Eric Bogatin and Teledyne LeCroy as we introduce you to five simple, yet essential, principles of signal integrity which we will apply to understanding how to interpret oscilloscope measurements from DC to 1 GHz bandwidth.

Many questions have obvious answers if we understand just a little bit about transmission lines and what the oscilloscope actually measures:

Topics to be covered in this webinar:

• Is it really true that the longer the cable, the longer the RC charging and the longer the rise time?
• Does this mean only short cables can offer high bandwidth?
• When should you use a 50 Ω input and when a 1 MΩ input to the scope?
• Why do I measure a rise time of 150 ns for the compensation signal on the front of the scope and others report it as 5 ns rise time?

Who should attend? Any engineer who wants a practical understanding of transmission lines and why this is so important in any oscilloscope measurement.

Much like driving from one point to another in a big city, routing an electrical signal between a test instrument and a device under test can require navigating a complex network of interconnected relays, wiring and interfaces. Instead of right and left turns, the ATE software engineer must determine the correct position setting of multiple relays to establish the desired route. 

In this training, you'll learn how Switch Path Manager (SPM) signal routing software accelerates the software development effort of Automated Test Systems, considerably reducing the number of lines of code required to route test instrumentation to the device to be tested.

EMC Live: Automotive 

Automotive electronics developments have impacted automotive EMC testing by exposing higher frequency RF technologies to the lab. AR is making this easier for the lab and Test Engineering by bringing state-of-the-art shielding capabilities to their product line-up by joining forces with Comtest, a leader in shielding technologies and RF absorber techniques. In addition to being a technology leader, AR is now a full-service EMC solution provider. We will discuss how AR chambers use the latest in RF technologies to make testing repeatable, reproducible, and safe from 10 kHz to above 40 GHz to support these new technologies in ways that legacy shielding could not. 

REGISTER NOW

Power electronics designs have inherent measurement challenges. This has led to development of many specialized high and low voltage single-ended and differential probes to meet the specific needs of this market. However, proper probe selection and use is critical for operator, equipment and DUT safety and also has a large influence on the accuracy of the measurement.

Join Teledyne LeCroy for this two-part webinar series as we provide tips to overcome these questions.

In Part 1 we will review the different HV rated probe specifications and topologies and explain what measurement each probe topology is ideally suited for.

In Part 2 we provide real-word examples and comparisons between a variety of different probes and amplifiers. Register here

Presenter: Ken Johnson, Director of Marketing, Product Architect Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

Time: 11 AM Pacific | 2 PM Eastern

Duration: 60 minutes including Q&A

Presenter: Mike Engbretson and Mike Micheletti

Have you thought about using an oscilloscope and a protocol analyzer together to debug USB system level interoperability failures? In this webinar learn practical methods for uncovering compliance and interoperability issues using an oscilloscope.

Register Here

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Don’t Let Ground Bounce Ruin Your Day

In this session (Part 7), Dr. Eric Bogatin will focus on ground bounce. Ground bounce is a common problem in packages, connectors and circuit boards that gets worse with shorter rise times. This insidious problem can cause enough cross talk to break almost any product. We will look at the principles behind the root cause of ground bounce, how we can measure the ground bounce in your system, and based on the root cause, how we can design ground bounce out of your next product.

Topics to be covered in this webinar:

Power electronics designs have inherent measurement challenges. This has led to development of many specialized high and low voltage single-ended and differential probes to meet the specific needs of this market. However, proper probe selection and use is critical for operator, equipment and DUT safety and also has a large influence on the accuracy of the measurement.

Join Teledyne LeCroy for this two-part webinar series as we provide tips to overcome these questions.

In Part 1 we review the different HV rated probe specifications and topologies and explain what measurement each probe topology is ideally suited for. Register here

In Part 2 we provide real-word examples and comparisons between a variety of different probes and amplifiers.

Presenter: Ken Johnson, Director of Marketing, Product Architect Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

Part 8: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

Current sense (shunt) resistors are commonly included on printed circuit assemblies to provide a convenient means to measure current flow somewhere in your circuit. How do you use that resistor to measure the actual current with your oscilloscope?

In this coffee break webinar we provide practical guidance on how to probe the voltage drop across the shunt resistor to minimize noise and accurately measure the current on your oscilloscope.

Topics to be covered in this webinar:

• Selecting the right probe for the measurement
• Rescaling the voltage output of the probe to a current value
• Considerations for accurate measurements

Presented by: Jonathan Shechter, Product Marketing Engineer

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

The industry's first NRZ and Manchester configurable protocol decoders accept a broad range of physical characteristics for NRZ- or Manchester-encoded signals.

Selecting battery test equipment is not as obvious as it might seem. The wrong choice will lead to major integration challenges as well as setbacks including hidden development costs, delayed test start dates, increased complexity, project risks and reduced safety.

This presentation will cover the top 10 factors to consider when deciding to buy a battery cycler, or building your own battery test system with sources and loads, or bidirectional power supplies. In this webinar, we’ll explain key considerations for testing batteries to ensure safety, product performance, flexibility, and time to market. Key topics include:

• Fundamental differences between battery cyclers and build your own approaches
• The hidden technical challenges in building your own test system
• Future-proofing your test solutions
• How to reduce time to market and improve engineering productivity 

Register Now!

If you cannot attend the live event, please register and we will send you the recording.

Join Teledyne LeCroy for our new three-part webinar series to learn more about how to accelerate and improve testing of PCIe® v. 4.0 and 5.0, USB4™, Thunderbolt™ 4, and DisplayPort™ 2.0 serial data links.

Nov. 19 - Part One: Identifying and Debugging PCIe Link Equalization Problems
Dec. 3 - Part Two: Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links
Dec. 16 - Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

Join us for Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

High-speed serial link transmitter testing can be optimized with the right tools, and valuable circuit design operating margin information can be extracted.

This webinar will provide an overview of a typical high-speed serial data transmitter test using USB4 as an example. We will synthesize a high-speed serial data signal, use a real-time oscilloscope to analyze the signal at a virtual receiver, and compare the virtually-received signal to a live signal. We will review signal integrity margin analysis and jitter, eye diagram, IsoBER contour and crosstalk eye measurements.

Who should attend?

• Signal Integrity Engineers
• Design and Validation Test Engineers

Presenters:
Mike Engbretson, Product Marketing Manager and John Smith, HSS Business Development Manager

For the most efficient validation, get the most analog channels and longest memory to capture your entire power sequence.

1. Start with WaveRunner 8000HD’s 8 analog channels, 16 with our OscilloSYNC™ option.
2. Add MSO capability for 16 digital lines, no sacrifice of analog channels.
3. Use 5 Gpts memory to capture the entire power on/off sequence.
4. Use automated measurements with Pass/Fail testing to validate timing over multiple acquisitions.

Watch the video to see how.

Technologies and design considerations are presented for the design of very high bandwidth oscilloscopes. These include chip, DSP and microwave technologies employed in some of the fastest waveform digitizers in the world.

We present a novel low-loss 3-spot mode coupler to selectively address 6 spatial and polarization modes of a few-mode fiber. The coupler is used in a 66 MIMO-transmission experiment over a 154-km hybrid span consisting of 129-km depressed-cladding and 25-km graded-index few-mode fiber.

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

We are all pretty good at setting a time window for our capture. But, what about the waveform memory that is used for the capture? How does this interact with the sample rate as we vary the time window? Can we segment the timebase to capture only the important circuit behaviors?

Topics to be included:

• Timebase, memory length and sampling rate – how do these impact our results?
• Timebase delay – pre- and post-trigger location
• Sequential timebase – capturing “just the facts”
• Scope preferences we forget are available

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

We transmit 32 WDM channels over 12 spatial and polarization modes of 177 km few-mode fiber at a record spectral efficiency of 32 bit/s/Hz. The transmitted signals are strongly coupled and recovered using 12 x 12 multiple-input multiple-output digital signal processing.

One of the most basic things to know when using any probe is “what is the maximum voltage the device can safely measure?” The answer isn’t as straightforward as you might imagine, it requires understanding several key probe specifications as well as the nature of your signal.

Single-ended Range

Everyone is pretty familiar with single-ended range: that's the maximum safe voltage input to ground, shown in Figure 1. Ground is directly tied to oscilloscope ground, which is tied to building ground. Therefore, when measuring voltage within this range using a single-ended probe, the ground connection cannot be a floating voltage, or you could damage the probe, the DUT, the oscilloscope...maybe yourself, as well. Single-ended voltage must be a grounded voltage on your board or something that could be tied to ground.

Dynamic Range and Maximum Non-destruct Input Voltage

Figure 2. Differential mode range is measured between inputs.

In this video, we show how to use LabNotebook with the Teledyne LeCroy MAUI Studio oscilloscope software. With LabNotebook, you can save your signals, setups and screenshots to share with a colleague or add to a report. For additional information visit, teledynelecroy.com/mauistudio.

The cable design for a automated test system is critical for repeatability and accuracy, it needs care and expertise. Depending on the application, a test engineer needs to consider test specifications, including voltage, current, temperature, insertion losses, and more. Unless the test engineer is an expert on cabling, researching wires and connectors can be a daunting task.

There are times when a standard cable assembly is not suitable, and there is a need for custom connectors and wire types or specific harness wiring. Our free online Cable Design Tool (CDT) is a simple and efficient way of creating these custom cabling solutions.

In this webinar we describe common causes of oscilloscope noise and how additive noise from the oscilloscope can be reduced to improve the quality of your measurement result, regardless of the starting resolution/noise of your oscilloscope.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

Register Now!

This webinar will introduce the M21 Video Analyzer/Generator for HDMI 8K and DisplayPort UHBR testing.

The presentation will provide an overview of the HDMI video generation features and the HDMI video analysis features through connection to external devices. We will also discuss the auxiliary channel analyzer (ACA) utility for monitoring the HDMI transactions over the DDC channel.

A high level roadmap will be provided to discuss the rollout of other important features such as DisplayPort analysis. Future M21 webinars will cover the DisplayPort analyzer features.

When: Thursday, August 3, 2023, 12:00PM Central Daylight Time

Register free by completing the form.

Presenter: Neal Kendall, Product Marketing Manager – quantumdata Product Family, Teledyne LeCroy

In Part 3 of our 2023 Oscilloscope Coffee Break Webinar Series we discuss the relationship between signal rise time and oscilloscope bandwidth and how to choose the right bandwidth of oscilloscope for your application.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Mastering MDI Return Loss and Mode Conversion Loss Test

In this session (Part 2), we will focus on the reflection measurements MDI return loss and MDI mode conversion loss. We will review the basic concepts of the S-parameters and their meaning in single ended and mixed-mode form with particular reference to the single balanced twisted pair. We’ll follow with a measurement demonstration.

Topics to be covered in this webinar:

• Automotive Ethernet and single-balanced unshielded twisted pair
• Mixed-mode S-parameter overview
• Why to measure common-to-differential mode conversion?
• Testing the fixture for mode conversion loss margin compared to the MDI requirement
• Introduction to MDI S-parameter testing

Who should attend? All HW engineers developing and testing Automotive Ethernet accordingly to the 100Base-T1 and 1000Base-T1 standards with particular reference to MDI S-parameters.

What attendees will learn? Background knowledge for MDI S-parameter Automotive Ethernet measurement and what to expect when testing it.

Time: 11 AM Pacific | 2 PM Eastern

Duration: 30 minutes

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Mastering Transmitter Droop, Distortion, Jitter and Spectral Density Test

In this session (Part 3), we will describe the requirements for the Physical Media Attachment (PMA) compliance tests with practical demonstrations using complex signals while indicating the procedures for obtaining the best measurement results and signal integrity.

Topics to be covered in this webinar:

• Maximum Output Droop
• Transmitter Distortion
• Transmitter Timing Jitter, Master and Slave
• Transmitter Power Spectral Density (PSD)
• Transmitter Peak Differential Output
• Transmitter Clock Frequency

Who should attend? Engineers and technicians looking to learn more about the physical layer compliance test process for Automotive Ethernet.

What attendees will learn? What to expect when setting-up and performing Automotive Ethernet physical layer tests. Each of the different tests will be covered in detail with hands-on experience.

Networking devices supporting 800Gbps Ethernet are now being developed, with some industry analysts predicting the next tech cycle of 1.6Tbps (Terabits per second) could arrive as early as 2024.

But the devil's in the details - and there are a lot of details.

Xena's new White Paper examines the technical options and challenges of bringing terabit Ethernet to life. Learn how faster electrical lane speeds, new modulation schemes and the need for better Forward Error Correction (FEC) mechanisms are playing a key role, as well as why you'll need to test changes to the Ethernet physical layer and transceiver form factors.

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Fundamentals of Compliance Test, Validation and Debug

In this session (Part 1), we will focus on the fundamentals of the Automotive Ethernet ecosystem, including a brief history and evolution of the standard, an overview of benefits of the new technology and the associated design challenges. We will conclude with an introduction into the test requirements and the analysis tools available to help troubleshoot and qualify designs.

Topics to be covered in this webinar:

• What is Automotive Ethernet
• Different variants of Automotive Ethernet
• Overview of OPEN Alliance
• Introduction to testing requirements

Who should attend? Engineers and Technicians who have just begun or will be working on Automotive Ethernet. This session is an introductory course.

What attendees will learn? Background knowledge for Automotive Ethernet, who uses it, why they are using it, and what to expect when testing it.

Presenter: Robert Mart, Director of Marketing

Machine Vision Challenge: Cement Board Inspection

A customer inspecting 4 ft. by 10 ft. white fiber-cement boards required a lighting solution to highlight small 5cm long and 1mm thick surface scratches and defects. They also identified significant surface concavity created during the manufacturing process on some of the 2cm thick boards. As a result, they required the flexible lighting solution to also assist their efforts to develop an identification and grading system to pass/fail board concavity.

The cement boards were inspected in motion, running 1 foot/second through an enclosed tunnel. The inspection setup required a low-angle, narrow beam throw for uniform illumination across the full surface of the board to identify the scratches. The tunnel setup also required the use of longer lights for full board coverage and to facilitate installation.

An additional inspection using the same area-scan camera, but with bright field oriented lighting, necessitated the two lighting orientations be independently controlled with an on/off trigger. The customer contacted Control System Integrators (CSI), Inc. to configure a lighting solution for this inspection challenge.

Ai Solution: High Intensity Bar Lights

Via Ai’s Distribution Partner, Kendall Electric, CSI, Inc. reached out to Advanced illumination to provide a dark field lighting solution for their customer. To match the size and uniformity needs, Ai suggested the LL174 High Intensity Bar Lights with a diffuse light conditioning.

These lights are highly customizable, each available in the 24” length demanded of the application. The configurable control options also allowed for the use of the iCS 3 Inline Cable Controller to enable constant or strobed power to the light. The longer length and controller options met the customer’s initial requirements to fit within the existing machine vision setup constraints.

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Advanced Measurements and Math

In this session (Part 2), we will develop skills for acquiring and performing measurements, waveform math, and analysis that isolate and help us locate amplitude and timing errors within an embedded design.

Topics to be included:

• Plotting measurement values over time
• Waveform math tools
• Measurement parameter Tracks and Trends
• Serial data triggering and decode
• Mixed signal digital capture and integration

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

3-Phase Power and Motors Masters Webinar Series

Join Teledyne LeCroy for this Learning Lab series on measuring high-power, three-phase and motor inverter and drive systems with an 8-channel high-resolution oscilloscope or motor drive analyzer. Learn about static and dynamic measurements, from AC line to inverter switching, and line outputs to motor mechanical performance.

How to Measure Power During Volt-second and Other Short Power Periods

In this session (Part Four), we will review examples of power calculated during power periods equivalent to a device switching time. This is especially helpful for understanding instantaneous control response time, as required for deadbeat-direct torque and flux control (DB-DTFC) and other rapid response control systems.

Topics to be included:

• Principles of defining the short power period Variable-flux electric machine analysis example DB-DTFC machine analysis example
• Dynamic loss calculation during rapid acceleration of servo motor

Who should attend? Inverter subsection engineers, motor/drive control system engineers, and inverter/drive systems engineers who design dynamic control and power systems that operate under highly controlled conditions.

What attendees will learn? Best in class techniques for measuring and understanding performance of and interrelationships between control and power sections.

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

In this webinar we define what acquisition memory is in a digital oscilloscope. We also define how acquisition memory, sample rate and capture time are interrelated.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

Objects with unique 3D aspects can make identifying surface defects with standard machine vision configurations more difficult. One solution to achieve feature-appropriate surface contrast is Photometric Stereo.

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Power Integrity in Multi-rail Embedded Designs Learning Lab

In this session (Part 3), we’ll demonstrate and teach how to characterize and validate the integrity of multiple power rails in a PDN network, including the interactions and control of VRM’s, POL’s, LDO’s by Power Management ICs in embedded designs.

Topics to be covered in this webinar:

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

4 Practical Real-world Examples of Embedded System Validation and Debug

In this session (Part 3), we apply the display, measurement and waveform math tools covered in Part 1 and 2 to specific embedded design application examples.

Topics to be included:

• Power rail integrity measurements and probing power rails
• Power rail sequence measurements
• Low-speed event correlation to high-speed event
• Correlating sensor signals with embedded serial data

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Become an Expert in DDR Memory Physical Layer Testing Series

Join Teledyne LeCroy for this 4-part DDR Memory Master Class to learn about the basics of DDR testing with oscilloscopes, including common test preparation and challenges, the difference between compliance and debug test tools, and practical tips and techniques to increase your DDR validation efficiency and apply the correct debug tools.

Beyond DDR Compliance Testing — Using Advanced Debug Tools

In this session (Part 2), we review the latest DDR test requirements and provide practical advice on solving test challenges. We will provide guidance on how to test to the latest JEDEC standards and proper use of debug tools to overcome test and validation challenges.

Topics to be included:

• DDR/LPDDR4, LPDDR4X, and DDR/LPDDR5 specification review
• Test system ‘bring-up’ and debug
• When are you ready to move from ‘debug’ to ‘compliance’?
• Implications of fully encoded command bus and DFE in LPDDR5 and DDR5
• How to send the proper test signals
• Read/Write eye separation
• Eye and jitter measurements

Who should attend? Design and validation engineers working to validate and debug DDR in embedded systems.

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Characterize Lossy Interconnects in High-speed Designs

Join Eric Bogatin and Teledyne LeCroy for this webinar exploring the properties of lossy transmission lines and how to extract their important figures of merit. All losses are frequency dependent. We introduce a simple way of estimating the losses expected based on the interconnect design and how to measure the losses using S-parameters.

Topics to be included:

• The root cause of losses
• Estimating the conductor and dielectric losses
• Extracting an important figure of merit from insertion loss
• How much insertion loss is too much?
• Estimating the maximum data rate of a channel from the insertion loss

Who should attend? Any Engineer designing, validating or using high-speed serial data links.

What attendees will learn? How to analyze insertion loss and interpret measurements in terms of highest acceptable data rate.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Real-time Spectral Analysis of Power Rails

In this session (Part 6), Dr. Eric Bogatin will explain and demonstrate how transforming acquired time-domain signals into the frequency domain will get you to the right answer faster, extract the important figures of merit of the signal, and help you find the root cause of a problem. Eric will introduce important principles to help you get the most out of your time and frequency domain measurements and analysis of signals. We’ll apply these techniques to look at high bandwidth signals, noise sources and power rails.

Topics to be covered in this webinar:

PCI Express® 5.0 Compliance Test Overview

Join Teledyne LeCroy for this two-part master class in PCI Express 5.0 – from electrical through Link layer and Transaction layer. PCIe 5.0 is approaching the time when initial compliance and interoperability testing can commence. Teledyne LeCroy PCIe Gen5 physical-layer and protocol test experts will focus on each test, explain the background theory, how the test procedure works, how passes and failures are determined, and how to track down and debug problems.

PCI Express 5.0 Electrical Compliance Test Overview

In this session (Part 2), we describe the new PCIe 5.0 electrical compliance test procedures – what’s new, what’s the same as past generations, and how to avoid the most common test pitfalls.

Topics to be covered in this webinar:

• Fixture characterization
• Transmitter electrical testing
• Transmitter Link Equalization testing
• Receiver Link Equalization testing
• PLL bandwidth testing
• What’s new in PCIe 5.0 compared to PCIe 4.0.

Who should attend? Design, validation and test engineers working on PCIe 5.0 devices.

What attendees will learn? How to be prepared for upcoming PCIe 5.0 electrical compliance test events.

Presenter: Dr. Patrick Connally, Product Marketing Manager

Date: Wednesday, September 6, 2023

Time: 11 AM Pacific | 2 PM Eastern

Duration: 60 minutes

How to Perform Double Pulse Testing (DPT) on GaN and SiC Devices

Join Teledyne LeCroy to see Double Pulse Testing performed on Gallium nitride (GaN) and Silicon carbide (SiC) power semiconductor devices. Learn more about various safety measures that need to be addressed before making measurements and what to infer from the captured waveforms.



Topics to be covered in this webinar:

In this webinar, we will help you to understand programmable resistors, their construction, why they are needed, resistor selection and look at some applications where sensor simulation is an integral part of the adopted test strategies to improve repeatability, reduce test times, and ultimately lower the cost of test. View the webinar here

A few of the takeaways are:

A Time Domain Reflectometer (TDR) displays the instantaneous single-ended or differential impedance profiles of an interconnect and the location of discontinuities. While this is valuable information, there is additional information we can extract by expanding to multiple ports and looking at not just the differential impedance, but also the common impedance and even the location of crosstalk and mode conversion.

Join Eric Bogatin and Teledyne LeCroy as we introduce the value of looking at multi-port and mixed-mode TDR and impedance measurements, the best measurement practices and how to analyze the results.

Topics to be covered in this webinar:

• Converting frequency domain into the time domain
• Impedance profiles and interconnect structures
• Measuring near- and far-end crosstalk
• Identifying the location of crosstalk
• Features that can cause mode conversion
• Three important consistency tests to always consider

Who should attend? Engineers who need to characterize the electrical properties of interconnects, or currently use TDR measurements.

What attendees will learn? How to use TDR measurements to interpret interconnect electrical features.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Join Teledyne LeCroy for our new three-part webinar series to learn more about how to accelerate and improve testing of PCIe® v. 4.0 and 5.0, USB4™, Thunderbolt™ 4, and DisplayPort™ 2.0 serial data links.

Nov. 19 - Part One: Identifying and Debugging PCIe Link Equalization Problems
Dec. 3 - Part Two: Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links
Dec. 16 - Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

Join us for Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

High-speed serial link transmitter testing can be optimized with the right tools, and valuable circuit design operating margin information can be extracted.

This webinar will provide an overview of a typical high-speed serial data transmitter test using USB4 as an example. We will synthesize a high-speed serial data signal, use a real-time oscilloscope to analyze the signal at a virtual receiver, and compare the virtually-received signal to a live signal. We will review signal integrity margin analysis and jitter, eye diagram, IsoBER contour and crosstalk eye measurements.

Who should attend?

• Signal Integrity Engineers
• Design and Validation Test Engineers

Presenters:
Mike Engbretson, Product Marketing Manager and John Smith, HSS Business Development Manager

SD-WAN was first introduced to provide a reliable and cost-effective backup to MPLS-based enterprise WAN connectivity. As IP and Internet networks have become more reliable, along with the growth in adoption of cloud services, SD-WAN has evolved and is replacing branch office routers as the preferred WAN connectivity solution.

According to Gartner, 60% of enterprises will have implemented SD-WAN by 2024 compared to just 30% today. At least 30% of enterprise locations will only have Internet WAN connectivity, which is twice the current number. The impact of SD-WAN on the WAN infrastructure market is also clear with Gartner expecting a Compound Annual Growth Rate (CAGR) of -3.1% from 2017 to 2024 as cheaper SD-WAN solutions replace more expensive branch office routers

Nevertheless, one should not make the mistake of thinking that SD-WAN is less complex or intelligent. Quite the contrary in fact. The latest generation of SD-WAN solutions are expected to be application-aware and capable of determining the optimal path through the WAN in real-time on a per application basis. This includes cloud services with direct offload from the branch to co-located cloud edge services. In addition, sophisticated security capabilities are provided to support Zero Trust Network (ZTNA) and/or Secure Access Service Edge (SASE) concepts.

The sophistication of modern SD-WAN solutions allows a true de-coupling of WAN connectivity from the underlying transport mechanism, which is predominantly Ethernet based. It also means that there is little insight into the data transport layer, only to the tunneled SD-WAN connections that are supported. As data consumption continues to grow and more sophisticated and demanding Internet-based services contend for public Internet resources, the underlying data transport layer networks supporting SD-WAN are becoming more dynamic and unpredictable. Multiple choices can be available, such as fixed broadband access over copper or fiber, Fixed Wireless Access (FWA) or 5G mobile broadband, but when should one choose these options, and can one be sure that the current measured performance will be maintained?

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

4 Practical Real-world Examples of Embedded System Validation and Debug

In this session (Part 3), we apply the display, measurement and waveform math tools covered in Part 1 and 2 to specific embedded design application examples.

Topics to be included:

• Power rail integrity measurements and probing power rails
• Power rail sequence measurements
• Low-speed event correlation to high-speed event
• Correlating sensor signals with embedded serial data

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

We demonstrate 12 x 12 multiple-input multiple-output mode multiplexed transmission over 130-km of few-mode fiber of a combined 6-space-, 2-polarization-, and 8-wavelength-division multiplex, using low-loss photonic lantern and 3D-waveguide mode multiplexers.

How to Perform Customized Analysis With an Oscilloscope

Data is commonly exported from an oscilloscope to another program (e.g., MATLAB®) for calculation and analysis. Are there better ways to get these results? Can the oscilloscope still be the main platform for post-export analysis? Are there additional external calculation and analysis tools that could be used? Is it possible to control the oscilloscope or other instruments using the same custom scripts or algorithms that perform calculations or analysis on the acquired data? Join us for an overview and advanced examples of best practices and capabilities for oscilloscope customization.

Advanced Customization Examples

In Part 2 of this 2 part series, we provide specific real-world examples of customization being used to solve specific measurement and control challenges.

Topics to be covered in this webinar:

Cable reliability, especially phase stability against Temperature change, is of critical importance in microwave and mmWave measuring. Junkosha has developed cables with excellent phase stability against temperature change through innovative materials and processing technology.

The oscilloscope has been a primary tool for electronic design engineers since the invention of that instrument, many years ago. The first decades of oscilloscopes were “analog” in nature.

This webinar will dive into details to help aerospace engineers select and apply the appropriate technology- exploring considerations such as including heat flux, transport distances, geometry and mass. Our subject experts will also be available after the webinar for specific questions on your application. Join us!

This paper addresses a new methodology for 12 Gbps interoperability that combines a concerted family of pathological channels, internal eye monitoring, and external EQ simulation tools, providing insight into an EQ optimization strategy that addresses the specific channel’s mix of crosstalk noise, jitter, and channel loss. This also provides a backplane designer the ability to configure a high-loss, crosstalk aggressed system.

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

Noise on the power rail may not only create bit errors due to voltage spikes, but it may also increase clock jitter. Clock jitter is an insidious source of noise difficult to debug.

In this webinar, we demonstrate how to measure the jitter in both clocks and data and identify the contribution from noise on the power rail. These techniques can be applied to any system in which minimizing clock and data jitter is important.

Topics to be covered in this webinar:

• Using time interval error (TIE) to measure jitter
• The statistics and spectrum of TIE as a way of characterizing jitter
• Typical jitter in various types of oscillator circuits
• Best practices to measure power rail noise
• The impact power noise can have on clock jitter
• Examples of clocked systems with high and low jitter sensitivity to power rail noise

Who should attend? Hardware and circuit engineers who design interconnects and clocked circuits.

What attendees will learn? This webinar will introduce you to how to measure jitter and power rail noise, and how to reduce the sensitivity of your clocks to power rail noise.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

Best Practices for 48V Power Conversion Testing

48 Vdc battery-powered system volumes will grow quickly in automotive and consumer applications. While the voltages are not inherently challenging, oscilloscope, probe and power analyzer innovation have lagged the trend towards >12V battery voltages.

Join Teledyne LeCroy as we describe new products and best practices and measurement techniques for validation and debug of 48 V power conversion systems.

Topics to be covered in this webinar:

Low differential group delay (DGD) between the modes of a graded-index few-mode fiber is obtained by combining segments with DGD of opposite sign. Transmission of mode-multiplexed 620-GBd QPSK over a record distance of 1200 km is demonstrated.

5G deployments are now underway across the globe but are merely the first steps in a multi-year journey for the mobile industry. Many practical challenges still remain, not least of which is the challenge of cost-effectively deploying 5G Radio Access Networks (RANs) at scale and assuring the performance of supported 5G services.

The 5G RAN architecture provides an open, virtual, packet-based network that extendsfrom the core to the radio antenna. The virtual architecture of 5G RAN with network slicing and new functional elements, such as the Central Unit (CU) and Distributed Unit (DU), enables multiple demanding services to share the same infrastructure without compromising on their specific performance requirements. Virtual, packet-based RANs also enable network sharing over open interfaces as well as multi-vendor implementations, both of which are important to the 5G business case.

Hardware appliances, such as the Remote Radio Head and Baseband Unit of 4G LTE are now replaced with virtual software running on whitebox or Commercial Off-The-Shelf (COTS) hardware. In 5G, the Baseband Unit is split into two new functions, namely the CU and DU. Both these functions can be located either close to the 5G core or close to the Radio Unit (RU) to meet latency and backhaul requirements. This leads to a much more dynamic fronthaul, midhaul and backhaul network, which is now collectively referred to as the 5G cross-haul or “X-haul” network.

It also means that the traditional aggregation architecture where higher capacity is required closer to the core is no longer the norm. As cloud computing and other real-time services move closer to the edge of the network, more traffic is likely to remain close to the subscriber requiring higher capacity X-haul networks with 10G, 25G and even 100G Ethernet connectivity.

When measuring the performance of the DUT, if the shift of the data transmission timing – also known as skew – occurs between multiple cable connections, the performance of the DUT cannot be accurately determined. Junkosha has developed a stable transmission rate cable against bending.

We experimentally demonstrate multiple-input-multiple-output transmission of a combined 3-space-, and 2-polarization-, and 5-wavelength-division multiplex in a 3-core microstructured fiber over 4200 km. This is the record transmission distance for spatial-division multiplexing in a fiber.

When designing a functional electronic test system, how signal switching is implemented in your test strategy can affect accuracy and repeatability. In this webinar we give an overview of the three most popular platforms used for switching today, explain the advantages of each of the various switching applications, and provide some basic questions to ask as you integrate any electronic test system.

A few of the takeaways are:

This webinar will review the fundamentals of ac loading for testing applications across residential, commercial, electric vehicles, aerospace, and military markets. We’ll dive into key features and functions of both traditional and modern ac loading conditions and their many applications across these industries. The ability for ac loads to emulate complex load profiles to include harmonics and sub-cycle transients is important for testing the device and/or the grid to meet modern day requirements.

Learn about the most effective test approaches and test solutions to ensure accuracy, product performance, safety, and reduced time to market. Example applications include testing the grid, inverters, lock rotor current, EVSE, avionics, UPS, switch and fuses, and more.

Key Technical Concepts:

• Regenerative power
• AC load 4 quadrant operation
• True power factor shift
• Linear, non-linear, inductive and capacitive loading
• Testing in various emulation modes: CC, CR, CP, SC
• How to create complex load profiles
• Harmonics and sub-cycle transients

Click here to register!

For ten years, I’ve had the honor of presenting a tutorial session at the IEEE EMC Symposium. I’m usually positioned right after Bruce Archambeault. This means I get to listen to Bruce talk about inductance. While I think of myself as a bit of an expert on inductance, I always learn something new when I listen to Bruce.

One example he shows, using a simulation of where current flows, will completely recalibrate your intuition if you have never thought about this question. This example stuck with me for more than a dozen years since I originally saw it. Recently, I had a chance to play with the Teledyne LeCroy CP031A current probe used with our scopes and I realized this classic simulation example could be demonstrated with a simple measurement.

Simulating Where Return Current Flows

You’ve got a scope, now how do you get the most out of it without spending a lot of money?

In this free webinar from Teledyne LeCroy, Eric Bogatin will show you the right way you can do five common SI and PI measurements with a budget scope and some simple probes you probably already have around. We’ll look at some of the common artifacts to avoid so you can get meaningful measurements.

Topics covered include:

• Probing a fast rise time signal to get its rise time
• Measuring a power rail with a 10x probe
• Measuring a low impedance power rail with a build it yourself power rail probe
• Measuring the source of near field pick up
• Using the FFT function to analyze the root cause of noise pick up

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelis, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

Teledyne LeCroy current probes are supported on every channel of every oscilloscope we make for the widest view of all your signals.

• 30 - 500 A input with high sensitivity for precise low-current measurements
• Powered from the oscilloscope, no external power supply required
• Like using your 3rd-party probe/sensor? Use the CA10 to adapt it to Teledyne LeCroy oscilloscopes

Teledyne LeCroy - Video Library

Join Teledyne LeCroy for this hands-on webinar where we will examine and analyze Physical Layer compliance testing of BroadR-Reach, 100Base-T1, and 1000Base-T1 Automotive Ethernet designs. Starting with Automotive Ethernet background, we then focus on the individual Physical Media Attachment (PMA) electrical tests as defined by the OPEN Alliance and IEEE standards.

Topics to be covered in this webinar:

• Defining Automotive Ethernet PHY layer
• Intro to Physical Media Attachment (PMA) compliance tests
• Device Test Mode generation, test setup and fixturing
• Details of each compliance test with live, hands-on analysis
  • Maximum Output Droop
  • Transmitter Distortion
  • Transmitter Timing Jitter, Master and Slave
  • Transmitter Power Spectral Density (PSD)
  • Transmitter Peak Differential Output
  • Transmitter Clock Frequency

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

We experimentally demonstrate transmission of 6 mode-multiplexed 20-Gbd-QPSK signals over 1200 km of three-core microstructured fiber (3C-MSF). An aggregate single-wavelength capacity of 240 Gbit/s is recovered by off-line 66 coherent multiple-input multiple-output (MIMO) digital signal processing.

Xena is proud to launch "Freya", our newest and fastest Valkyrie test module. The first of a new product family based on 112Gbps PAM4 SerDes, Freya is aimed at first movers in the 800GE space and designed for 800G switch, transceiver and PHY design validation & Quality Assurance.

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

It’s circuit debug time! Let’s use the oscilloscope’s triggering features to define where we start our investigation to find the troublesome circuit issue.

Topics to be included:

• Trigger Modes – why is my scope display blank?
• Trigger selections – lots of choices to define when we capture data
• Trigger coupling, filters and pre-triggering
• Update rates – maximizing the amount of data captured

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

Time: 11 AM Pacific | 2 PM Eastern

Duration: 30 minutes

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

Weiss Technik will educate the audience on Options & Accessories within environmental test chambers. The webinar will explore and discuss what to look for and best practices for options and why they are used.

This FREE Webinar will help you learn more about:

• Overview
• Chamber Cabinet Options
• Humidity Options
• Refrigeration Options
• Safety Options
• Specialty Options
• and MORE!

Click here to Register!

Selecting the right cable is crucial for both Microwave and mmWave applications. Indeed, measurements are not accurate nor reliable unless appropriate cables are used. This video outlines how to select the most appropriate cable for any given purpose.

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Debugging PHY Layer Link Communication Learning Lab

In this session (Part 4), we review Automotive Ethernet link communication and explore how to debug and troubleshoot these links using an oscilloscope during an interactive session with live signals. We will look at both the physical and protocol layers during this Learning Lab webinar.

Topics to be covered in this webinar:

In this webinar we define what sample rate is and what high sample rate provides. We also describe minimum sample rates required and maximum practical sample rates needed for your signal and your oscilloscope.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

This Webinar presents the various challenges that ATE system engineers face when architecting a cabling and interface system. It also discusses the impact that design decisions have on the overall performance of the test system.

A few of the takeaways are:

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

SI/PI Measurements on a Budget

In this session (Part 4), we will show you how you get the most out of your oscilloscope for power integrity measurements without spending a lot of money, including the right way you can do five common SI and PI measurements with a budget scope and some simple probes you probably already have around your lab. We’ll also show some of the common artifacts to avoid so you can get meaningful measurements.

Topics to be covered in this webinar:

Ground bounce is a common problem in packages, connectors and circuit boards. And it gets worse with shorter rise times. This insidious problem can cause enough cross talk to break almost any product.

In this webinar, we will look at the principles behind the root cause of ground bounce, how we can measure the ground bounce in your system, and based on the root cause, how we can design ground bounce out of your next product.

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelis, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

Delivering consistently accurate results is integral for the flexographic industry. When a customer in this industry sought to update their analog inspection system, they sought the expertise of ClearView Imaging and Matrox® Imaging to provide an automated vision-system-driven mounting machine. Comprising a Matrox Imaging vision controller and software, this customized system is able to locate precise targets on flexographic plates, using advanced illumination techniques and software tools to address noise, locate shapes, and matching patterns.

EMC Live: Automotive 

Anechoic chambers are necessary for many of the tests involved in automotive EMC testing. We will be looking into what is needed in today’s automotive EMC chamber and discussing shielding effectiveness, how to properly size a chamber, 40 GHz performance, and other topics that could affect accreditation. Elements sometimes overlooked will also be identified, such as fire detection & suppression and door maintenance. 

REGISTER NOW

Time: 11 AM Pacific | 2 PM Eastern

Duration: 30 minutes

In this video, we show how you can use scripts to exchange data in real time between Teledyne LeCroy MAUI Studio oscilloscope software and third-party applications like MATLAB, Excel and LabVIEW. For additional information visit, teledynelecroy.com/mauistudio.

The proliferation of IoT “smart” devices used in the homes, commercial buildings, and city infrastructure, emphasizes the need to test for Electromatic Compatibility (EMC). IoT devices such as appliances, sensors, and cameras to name just a few are strictly mandated to comply with EMC standards. However, the real-world application may give rise to untested opportunities for RF interference. This presentation will discuss these real-world scenarios and provide guidance on testing techniques to mitigate potential for interference.

Click here to regsiter.

How to Perform Customized Analysis With an Oscilloscope

Data is commonly exported from an oscilloscope to another program (e.g., MATLAB®) for calculation and analysis. Are there better ways to get these results? Can the oscilloscope still be the main platform for post-export analysis? Are there additional external calculation and analysis tools that could be used? Is it possible to control the oscilloscope or other instruments using the same custom scripts or algorithms that perform calculations or analysis on the acquired data? Join us for an overview and advanced examples of best practices and capabilities for oscilloscope customization.

Fundamentals of Customized Analysis

In Part 1 of this 2 part series, we describe the range of capabilities available to customize measurements, math, and user interface using a Teledyne LeCroy oscilloscope as an example.

Topics to be covered in this webinar:

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Signal Display and Measurements

In this session (Part 1), we will discuss the various signal display and measurement tools available in oscilloscopes and how to avoid the traps and pitfalls that lead to inaccurate or inefficient measurements. We will also review how to extract circuit details from both short and long record acquisitions to aid in debugging of embedded designs.

Topics to be included:

• Improving measurements with multi-grids
• Analytical waveform views
• Using measurement parameters effectively
• Best uses of statistical data and views
• Pass/Fail parameter testing

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Advanced Measurements and Math

In this session (Part 2), we will develop skills for acquiring and performing measurements, waveform math, and analysis that isolate and help us locate amplitude and timing errors within an embedded design.

Topics to be included:

• Plotting measurement values over time
• Waveform math tools
• Measurement parameter Tracks and Trends
• Serial data triggering and decode
• Mixed signal digital capture and integration

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

USB Type-C® Technologies Webinar Series

Join Teledyne LeCroy for our webinar series on USB Type-C technologies with a focus on the physical layer, from an introduction to the various technologies in the Type-C ecosystem to USB 3.2, USB4™, Thunderbolt™, DisplayPort™, USB4 Type-C sideband (USB Power Delivery, DisplayPort AUX, USB4 SB) testing.

USB3.2 Physical Layer Compliance Testing and Debug

In Part 3, we will focus on the USB3.2 specification given its ubiquitous use for USB peripherals. We will cover new test requirements for the USB3.2 CTS and the tools for testing it.

Topics to be covered in this webinar:

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

Why do we care about vertical dynamic range? How do we take the most advantage of this to achieve the highest accuracy and precision? In this session we review your oscilloscope’s vertical gain and why we should care about it.

Topics to be included:

• Vertical dynamic range – why do we care?
• Effects on measurement accuracy
• DC versus AC coupling – pros and cons
• Should we overdrive the scope?
• Vertical offset versus scope sensitivity

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.