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Maury MW - VNA Calibration Standard - Mismatch Load Series
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Precision standard mismatches are fixed coaxial terminations, which are used to introduce a known VSWR into a 50 ohm transmission system. These mismatches are extremely useful in a wide variety of applications and are quick and easy to use. They can be used to calibrate swept reflectometers, verify network analyzer calibration, establish impedance references in TDR measurements.
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Frequency Range |
Measurement Range |
|---|---|
| DC to 50 GHz | 1.2:1, 1.5:1, 2:1 |
More Product Information
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Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
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Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
High resistance decade with built-in test signal meter for calibration of high resistance meters up to 6 kV. Based on M6xx Real-Resistance decade series with short function for short current testing.
- 10 kΩ - 100.0 GΩ, short function
- Hot-switching up to 6 kVdc limit
- Test voltage and current indication
- Directly compatible with most commercial VNA’s
- Available as polynomial and characterized device kits
- Measure S-Parameters with uncertainty when used in conjunction with Maury’s Insight software platform
Maury offers coaxial and waveguide VNA calibration kits.
Coaxial calibration kits are offered in Polynomial SOLT, Characterized Device (CD) SOLT, and TRL, depending on the connector series. Where available, CD kits improve calibration accuracy when compared to SOLT kits based on polynomial definitions as each calibration kit is provided with individually characterized short, open and fixed load standards, whose S-parameters can be loaded into commercial VNAs directly or when used with Maury’s Insight™ software platform. When combined with Insight™, users will be able to quantify the uncertainty contribution of their calibration kit to their overall measurements. CD cal kits result in TRL-like accuracy with fixed-load SOLT ease-of-use.
65 ppm AC/DC multifunction calibrator designed specifically for calibration of 3½ and 4½ digit multimeters. 1050 V, 20.5 A, resistance, capacitance and temperature packed inside ultra portable, 11 kg body.
- Compact, light, ideal for onsite calibrations
- 1050 V, 20.5 A, resistance, capacitance, TC, RTD and frequency
- Basic accuracy 60 ppm
- All-round calibrator for 3.5 and 4.5 digit multimeters
- Ideal for applications requiring high ENR and immunity to large incident RF power
- Low VSWR
- Built-in isolator
The NC3400 Series coaxial AWGN noise sources are an excellent choice for applications requiring high ENR and immunity to large incident RF power, such as ATE, radiometer, and radar systems. The calibration accuracy and flatness of the NC3400 Series noise sources are enhanced by their low VSWR. The built-in isolator provides almost constant output impedance as the noise source bias is switched on and off. The isolator also protects the noise diode from incident RF power (consult the factory for higherpower units).
An SMA female connector is standard for the RF output and a BNC female connector is standard for the bias input. Other connectors are available as options.
Achieve accurate, reliable frequency and time interval measurements with Keysight universal frequency counters, available at Transcat. Designed for engineers, technicians, and calibration professionals, these advanced instruments deliver fast measurements, high resolution, and exceptional accuracy across a wide range of electronic test applications.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz
Consults with our experts for any questions regarding your Keysight agilent data acquisition loggers daq needs. We offer test, measurement and monitoring products and software such as the Keysight DAQ973A Data Acquisition System and Keysight DAQ970A Data Acquisition Systems. These products are used in electronic design, manufacturing, and network troubleshooting, as well as in electrical, industrial, medical, process and calibration applications.
- SPA available from 70KHz to 20/40/70/110/125/145 and 220GHz. Also available for banded configuration to 1.1THz.
- Dual SPA mode available: suitable for Mixers/Amplifier/ Harmonics /Spurious testing.
- SPA available on all ports. User can define which port to use as SPA port.
- Several detection types available in classical mode: Peak, minimum, RMS, Mean.
- Various math functions can be applied on SPA mode like Min hold/max hold/ user defined equations.
- Sources and receivers can be independently configured. Can be used as Tracking Generator.
- For units that have a dual source, a dual drive option is available. Support for external source control also possible.
- Phase synchronization for units with Dual source available. This feature allows users to control and configure the phase between the two sources.
- Source and receiver attenuator available with VNA can be activated in SPA mode. Recommendation to use option 62 (with attenuator on receiver side) for measuring the spectrum content of high-power devices.
- Software option: easy to install and upgrade existing user equipment.
Maury Microwave
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Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.
