ULTRA UHC series polypropylene based broadband electromagnetic absorbers are the latest technology for RF test applications.

The polypropylene material has a highly uniform carbon density, throughout the material, which provides for more predictable results with no discontinuities.

It is the unique production technology which is the critical factor in achieving the highest electromagnetic reflectivity performance in an antenna measurement anechoic chamber or an emc chamber.

As an international EMC chamber supplier, we provide these polypropylene broadband absorbers for EMC test chambers worldwide.

• High Power Density: 600 watts in 1U (1.75 inches) high, half rack (8.5 inches) wide; no top or bottom clearance spacing required. 
• Near Linear Ripple & Noise Ripple as low as 2.5mV rms, noise as low as 15mV p-p. 
• Remote Control 
• LXI Compliant Ethernet LAN / RS-232C (16 bit) 
• IEEE-488.2 / RS-232C (12 bit) 
• Standard analog programming 0-5V, 0-10V, or 0-5kΩ.

• The Wide Linear Diffuse Light series is ideal for the inspection of elongated or cylindrical objects. 
• Perfect for inspections requiring a multi-camera setup. 
• Can be provided with up to 4 viewing ports. 
• Expandable lengths from 6” – 36” (152 – 194mm) in 6” increments.

Flexibility

• Different substrate carriers for wafers up to 200 mm or single dies
• Probe cards and/or up to eight positioners
• Optional thermal chuck (-60°C to 300°C) and pressure regulation
• Accessories available, such as black bodies and optical motion analysis tools
• Optional upgrade for 300 mm wafer
• Designed for industrial environments
• Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
• Ideal for small structures

See "Specifications & Details" tab for more key features

• Power bypass inductance: 8 nH
• Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
• Supports collinear and non-standard needle configurations
• Up to 16 DC for standard; maximum of 24 DC for custom
• Ideal for probing the entire circuit for functional test
• DC probes can provide power or slow logic to circuit under test

• PowerFlex design provides higher currents at lower voltages enabling one model to meet many different voltage/current requirements. 
• Compact design for bench use or rack mounting (1/2 or 1/4 rack width) 
• True analog controls with digital settings locking (S-Lock) 
• Mixed-mode regulation with linear final regulation for low noise 
• Dual models have isolated voltage tracking and synchronous on/off. 
• P models have RS-232, USB, and LXI-compliant LAN interfaces plus duplicate rear terminals. GPIB Optional.

The MVG-Orbit/FR performance series has recently been expanded to include medium-duty, dual-axes positioners: the new AL-438X series. Thanks to their low profile design and advanced drive mechanism, these symmetrical AZ/EL positioners ensure accurate, balanced rotation, and

Their rugged yet straight-forward construction ensures maximum reliability and trouble-free operation, yielding the best size and weight / performance ratio. This particular series provides a counter weight option which improves overall system stability and accuracy while allowing for higher DUT loads. A large variety of options is available for this ORBIT/FR standard product family.

MVG supplies a range of ferrite tiles for EMC test chambers where space is limited. Ferrite tiles complement or subtitute pyramidal absorbers to save space in the anechoic chamber.

• All-in-one smart module: no separate electronics 
  • Runs directly from USB adapter 
  • USB, I²C or SPI interface 
• Small size: less than 29 x 20 x 10 mm 
• High resolution: 0.5 μm
• Absolute encoding: no homing 
• Long stroke: 6 mm 
• Low power use: 3.3 V DC input, < 0.75 W when moving 
• High repeatability and low runout