The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.

With BARCUDA VP230 you can test and program assemblies with or without JTAG/Boundary Scan - with no need to configure a special in-house test system.

With a standard, robust interface "VPC G12 Receiver" from Virginia Panel Corporation (VPC), you can choose the adapter supplier (for needle bed adapters) for contacting your assembly and implement any mechanical requirements.

BARCUDA VP230 is equipped with a complete power-up unit and TAP control for 16 boards, which can be scaled up to 32 boards. It can also be expanded with analogue measurement cards, additional I/O channels and your specific hardware.

The TBST line of shielded tents is designed to suppress interference from ambient noise when carrying out EMC pre-compliance measurements with sizes of 200 cm x 100 cm x 100 cm, 124 cm x 64 cm x 60 cm or 86 cm x 48 cm x 48 cm. The 200 cm and 124 cm tent can accommodate any Tekbox pre-compliance test equipment such as LISNs or TEM-cells. The 86 cm tent will fit the TBTC0/1/2 and all our LISN.

SCANFLEX II CUBE is the new generation modular JTAG/Boundary Scan controller. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform.

• 8 independent and parallel Test Access Ports (TAP) for up to 100 MHz
• Synchronized operation of embedded test, debugging and programming
• Programmable multifunctional 64 channel I/O signal unit
• Programmable TAP protocols for numerous processor debug interfaces
• Support of up to 31 parallel controlled SCANFLEX I/O modules
• Controllable via USB 3.0 and GBit LAN

• Comprehensive Test Solutions - Our CTS 4.0 Series offers complete test solutions for emissions and immunity compliance testing of AC and DC power products, ensuring your products are ready for global markets.
• Single & Three Phase Operation - Offers flexibility
• Direct PC Bus Access - Provides high sampling rate and resolution for accurate measurements and high-speed data transfers
• PC-Based Harmonic & Flicker Testing - Provides real-time full-color data display updates and continuous PASS/FAIL monitoring
• Supports Global Standards - Supports European and Japanese standards
• Easy To Use Interface - Provides IEC test setup, data analysis, display, MS Word test reports, and data files generated in MS Excel format
• High Resolution - Data storage to disk for post-acquisition analysis and reporting
• Single Step - Single Step and Fast Forward replay of recorded test data at 200 mSec

XenaManager is used to configure and generate streams of Ethernet traffic between Xena test equipment and Devices Under Test (DUTs) at all speeds up to 800Gbps, and analyze the results. It can also be used to add various forms of impairment up to 100Gbps when using the Chimera network emulator.

The user-friendly interface makes XenaManager an effective tool for performing a wide range of core test scenarios for semiconductor & Network Equipment Manufacturers (NEMs), network service providers, and hyperscalers.

Quantity in Stock: 2

• Compact design only 16x40mm cross section
• Play-free guidance up to 3Nm rolling moment
• Self-locking
• Low clamping dimension (from 24mm)
• Interchangeable positioning tables
• Scale display in millimeters
• Suitable for industrial and laboratory use
• 150mm stroke
• Feed 1.5mm per revolution
• After fixation, the slide is non-shifting up to 2000N
• Can be combined to any multi-axis arrangement
• Compatible with autoVimation clamps and profiles
• Adaptable to all profile sizes
• Magnetic tape and digital display optional

• Up to 96 differential channels per full rack mainframe 
• Constantly monitor input signals for fault conditions 
• Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths 
• Inputs can be masked, inverted, and combined to produce interrupts 
• Can be used as a time stamp module and as a digital I/O 
• Programmable debounce circuitry prevents erroneous readings 
• 10 V and 100 V input ranges 
• On-board memory stores events with IEEE 1588 timestamps 
• Synchronize reading of input states with other scanned analog channels