• Highest resolution – 12 bits all the time 
• More capability – integrates multiple instruments into one 
• Comprehensive probe support – supports over 30 probes in 9 categories 
• MAUI with OneTouch user interface for intuitive and efficient operation

AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

• 500 MHz - 4 GHz bandwidths 
• Up to 40 GS/s sample rate 
• 15.4” capacitive touch screen 
• MAUI with OneTouch 
• Powerful, Deep Toolbox 
• Exceptional Serial Data Tools 
• 16 digital channels with 1.25 GS/s 
• Huge Applied Offset Range 
• Optional Application Packages

• Up to 20 GHz bandwidth and 80 GS/s sample rate
• The most advanced oscilloscope user interface
• The industry’s only true hardware 14.1 Gb/s serial trigger
• Low Jitter Measurement Floor and exceptional timebase stability
• Comprehensive set of serial data analysis, debug, validation and compliance tools
• Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility
• Integrated standard and custom measurements and math functions for unrivaled analysis capability
• Multi-lane serial data eye, jitter and crosstalk analysis
• Real-time de-embedding, emulation, and equalization

• Available in 250 MHz and 350 MHz models.
• 2, 4 and 8 channel modes.
• 16-bit vertical resolution.
• Max Sampling rate of 1.2 GS/s.
• Max sinewave frequency of 250 MHz and 350 MHz respectively.

The disruptive and innovative architecture enables to generate/add 8, 16 or 32 channel digital patterns (respectively on 2,4 or 8 analog channels platform) and to operate all models in true arbitrary mode or Direct Digital Synthesis (DDS) mode. Thanks to their high performance, versatile functionality and outstanding usability, the HD T3AWG3K series is the ideal AWG generator for today's and tomorrow's test challenges.

With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.

• Uses standard PC Ethernet port & hardware 
• Supports cable lengths up to 100 m (CAT-5e or CAT-6) 
• Simplified set-up with field proven Sapera LT software featuring CamExpert 
• Engineered to accommodate industrial environment with a ruggedized screw mount RJ-45 connector

• Latest Global and Rolling Shutters sensors from Sony® - from 2 to 12 MP
• USB3 Vision interface
• Compact fully-enclosed design with features needed by modern vision systems
• Provide advanced vision performance while using less power, less space, and fitting increasingly tight industry budgets

High voltage differential probes provide high CMRR over a broad frequency range (up to 400 MHz) to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.