Teledyne LeCroy - Probe Adapters
Probe adapters provide simple and easy interface of third-party probes as well as change between the different Teledyne LeCroy Oscilloscope input and cable types (ProBus, ProLink, K/2.92 mm, BNC and SMA). Depending on the adapters, changing between the Teledyne LeCroy Oscilloscope's input type may have an effect on the overall performance of the channel.
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Products |
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TekProbe to ProBus Probe Adapter |
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ProLink to 2.92mm Adapter with Probe Power and Communication Pass Through |
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ProLink to 2.92mm ProAxial Adapter with Probe Power and Communication Pass Through |
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2.92mm to ProBus Adapter with Probe Power and Communication Pass Through |
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2.92mm to ProLink Adapter with Probe Power and Communication Pass Through |
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More Product Information
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
- Allows TekProbe interface level II probes to work with any ProBus-equipped Teledyne LeCroy oscilloscope
- Automatic probe detection
- Provides all necessary power and offset control to the attached probe
- Supports probes up to 4 GHz
- Easy firmware updates
- Wide variety of probes supported including: Preamplifiers, Current Probes, Single-Ended Active Probes and Differential Active Probes
Fully Integrated: With the ProBus™ interface, the AP033 becomes an integral part of the oscilloscope. The probe sensitivity and offset can be controlled from the oscilloscope front panel, the probe front panel, or by using remote control commands (GPIB or RS-232). Sensitivity, offset, input capacitance, and common mode voltage range are displayed on the oscilloscope screen. When used with a LeCroy digital oscilloscope, no external power supply is required.
- Four operating modes: – CC, CV, CR, CP.
- Static, Dynamic and Sequence mode support.
- Built in Application Functions - Short Circuit Test, Battery Test Mode, CR-LED Mode, OCP and OPP Test.
- Provides a load of up to 300 Watts.
- Programmable and analog external control.
AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.
Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.
From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.
Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.
- Ideal probe for up to 48 V power conversion
- 250, 500 MHz and 1 GHz bandwidth
- 80 V dynamic range
- 60 V common mode
- Highest accuracy
- 0.5% gain accuracy
- Precision gain calibration
- Best LF flatness (0.1 dB)
- Lowest noise and highest rejection
- Wide variety of tips
- High performance solder-in
- Browser
- Single pins and header
- Mini and micro grabbers
- Socketed connections
- High temp solder-in
- Y-banana adaptor
- ProBus active probe interface
RAPIDO is a multi-site programmer for inline programming and testing.
Are you developing your next electronic assembly and are dealing with "test and programming" concerns?
Your complex boards feature difficult to contact fine-pitch components (e.g. BGA, FPGA) while test and programming still must be efficient?
RAPIDO is an outstanding, "lightning-fast" solution for programming and test using embedded system access (ESA) technologies. Special mechanics ensure precise board contacting from both sides, even for high probe counts.
The system can easily be integrated into a production line, keeping up even with high-volume manufacturing cycle times.
Measurement Accuracy
- Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
- Minimize AC and spectral noise with effective shielding capability
- Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
- Shortest signal path test integration for accurate, thermally stable, and low-error data collection
See "Specifications & Details" tab for more key features
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.