FormFactor - Cascade ACP Probe – Cryo/Vacuum - Superior mechanical properties at cryogenic temperatures
-
Functional temperature range of -263 to +150°C
-
Stainless steel tip material for thermal decoupling
-
Coaxial cable with TCE matched inner and outer conductors
-
Consistent tip geometry even at cryogenic temperatures
Designed to provide superior mechanical properties at cryogenic temperatures while maintaining solid RF measurement performance. Functional temperature range of -263 to + 150 ° C. Consistent tip geometry even at cryogenic temperatures.
More Product Information
-
Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
-
Enables up to 5x faster time to accurate data
-
Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact
-
RF/microwave device characterization, 1/f, WLR, FA and design debug
-
Wide range of extremly performant, reliable thermal chuck systems from ATT
-
Easy on-screen navigation, wafer mapping, and operation of accessories and thermal systems with Velox
-
User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
-
Multi-purpose SIGMA instrument integration kit
-
Shorter cabling and universal chuck connection
-
Triax probe with protected guard
-
Triax design for low-leakage measurements up to 3 kV
-
Special chuck surface coating
-
High-isolation ready
-
Arcing protection
-
Shield Enclosure with interlock
-
Advanced grounding concept
See more Key Features on Specifications & Details tab
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Probe positioners placed inside vacuum chamber
-
Short and stable probe arms
-
Intuitive, manual drives
-
Front loading capability through load door
-
Software control of chuck for fast step-and-repeat testing of the entire wafer
-
Fast step-and-repeat testing of the whole wafer
See more Key Features on Specifications & Details tab
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
-
Highly stable granite base
-
Independent, coarse movement of X and Y axes, combined with easy fine adjustments
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Full thermal range of -60°C to +300°C
-
Low-profile, straightforward design
-
Spacious top chambers for up to 12 positioners
-
Reduces electrical noise by providing a fully electromagnetically shielded, ultra-low-noise, light-tight environment
-
Enables accurate low-noise measurements of atto amperes, femtofarads and microvolts at temperatures down to -60°C
See more Key Features on Specifications & Details tab
Ultra Low Temperature
-
Pulse tube cryocooler for cryogen free 4K temperatures
-
Two stage ADR provides solid state cooling down to 30mK
-
Sample stage mounting at both 1K and 50mK
Configurability
-
Multiple stage feedthroughs for thermally intercepting the signals
-
Two large electrical bread boards for more configurable space
-
Rapid cool options for faster cooldowns
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
-
Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
-
Online design configuration tool helps you to specify your probe in minutes
-
All designs are fully quadrant compatible
-
Full solution includes probes, calibration substrates, stations, accessories and software
-
Scalable architecture for future needs
-
Functional temperature range of -263 to +150°C
-
Stainless steel tip material for thermal decoupling
-
Coaxial cable with TCE matched inner and outer conductors
-
Consistent tip geometry even at cryogenic temperatures
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
