FormFactor - Cascade ACP Probe – Cryo/Vacuum - Superior mechanical properties at cryogenic temperatures
Mfg: Matrox
Model: HEL5MDBCLE
Condition: Open Box
Description: Helios Dual-BASE Camera Link® PCIe x4 Frame Grabber with 512 MB DDR SDRAM and Cable Adaptor Board
Price: $1,970.00
Item is in stock and ready to ship.
Quantity in Stock: 1
More Product Information
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Thermal range: -60˚C to 300˚C available
-
Upgrade path to meet your future needs
-
Stable and repeatable measurements over a wide thermal range
-
Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
-
Advanced EMI-shielding with PureLine with AttoGuard technologies
-
Best solution for low-noise and 1/f measurements
-
Minimize AC and spectral noise
-
Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
-
Locking roll-out stage
-
Innovative microscope remote control
-
Intuitive ergonomic stage controls
-
Quick, safe, and comfortable wafer access
-
Easy on-wafer navigation
-
Fast setup and test data gathering
-
Dedicated Velox version for manual probe stations
-
AugmentedAlign tool with on screen markers for improved RF measurement accuracy
-
Quick and easy probe tip navigation
-
Z drive can work in the same range as the chuck
-
Enables higher separation gap while the DUT stays in focus
-
Automatically configure and optimize performance
-
24/7 operating
-
Increased MTBF
-
Protects the measurement setup
-
Prevents involuntary mechanical contact between lens and probes
See more Key Features in Specifications & Features tab
-
Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
-
Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
-
Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
-
Calibration Monitor and Re-calibration – System will
continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
-
Infinity Probe: best for Al (Si)
-
ACP Probe: best for AU (III-Vs)
-
|Z| Probe: robust solution (long lifetime)
-
RF chuck ±3 μm surface planarity
-
Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
-
Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
-
Automated calibration monitoring
See more Key Features on Specifications & Details tab
-
Replace costly and inflexible test fixtures with easy-to-use probe tips
-
Long lifetime – typically over 1,000,000 contacts
-
GS/SG footprint up to 4 GHz and GSG up to 20 GHz
-
High-power RF test: up to 30 Watts
-
Test at temperatures from -60°C to 200°C
-
Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
-
Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
-
Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
-
Power bypass inductance: 8 nH
-
Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
-
Supports collinear and non-standard needle configurations
-
Up to 16 DC for standard; maximum of 24 DC for custom
-
Ideal for probing the entire circuit for functional test
-
DC probes can provide power or slow logic to circuit under test
-
Fully isolated experiment space for true 4K temperatures during probing
-
Cryogenic positioners to provide large travel ranges without warming up the device
-
Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
-
A soft vacuum bellows provides a compliant mounting interface for the cryocooler
-
Quick release vacuum feedthroughs for easy configurability
-
A large rectangular port for high signal capacity
See more Key Features in Specifications & Details tab
-
Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
-
Application flexibility, ideal for use in high frequency applications
-
Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
-
Suitable for integration with vibration isolating tables
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
Document
