• Reliably and efficiently acquire at up to 25 Gigabit/s per port through onboard packet processing 
• Maintain maximum flexibility with support for generic GigE Vision cameras 
• Readily and cost-effectively support multi-camera setups through two ports, together capable of handling up to 32 cameras 
• Cater to a range of cabling needs with support for copper and fiber-optic Ethernet cabling 
• Directly license Aurora software, formerly Matrox Imaging Software, with integrated license fingerprint and storage 
• Monitor and troubleshoot acquisition performance in detail using Aurora Gecho event-logging tool

• Device and operation are according to the standard IEC 60811-506 (IEC 60811-1-4) point 8.5
• Case set offers all required weights for the test
• Easy operation
• Very robust and solid construction
• Steel impact piece included
• Up to 3 Samples can be tested simultaneously
• Device suitable for positioning in a cold chamber - Product No.: 402.0020.02

• 2 in 1: device contains the Hot Set Test as well as the Heat Pressure Test
• Robust and compact set including the device and an equipment case
• Possibility to attach a thermometer directly near the sample
• Measurement according to the cable standards IEC 60811 -507 (Hot Set Test) and IEC 60811 -508 (Heat Pressure Test) regarding sample attachment and weight attachment
• Precise choice of weights due to practical containers
• Simultaneous measurement of up to 3 cable or tube samples

• Test plan development
• Order administration
• Archiving of obtained test results
• Creation of result lists according to the test plans
• Correct and structured filing of test results
• Exceedance of tolerance limits are immediately reported and saved
• Possibility to connect with external measuring devices (please inquire type)
• Connection with a SQL or MS Access© database possible

• Solve machine vision applications efficiently by constructing flowcharts instead of writing program code, using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying
• Use a single program for creating both application logic and operator interface
• Leverage deep learning for visual inspection through image classification and segmentation tools
• Rely on a common underlying vision library for the same results with an Iris GTX smart camera, vision systems or third-part computer
• Work with multiple cameras all within the same project or per project running concurrently and independently from one another, platform permitting
• Interface to Zebra AltiZ and third party 3D sensors to visualize, process and analyze depth maps and point clouds
• Communication options include discrete Zebra I/Os, RS-232, and Ethernet (TCP/IP, CC-Link IE Field Basic, EtherNet/IP, Modbus, OPC UA, and PROFINET, and native robot interfaces)
• Maximize productivity with instant feedback on image analysis and processing operations
• Receive immediate pertinent assistance through an integrated contextual guide
• Maintain control and independence through the ability to create custom flowchart steps
• Test communication with PLC using the built-in PLC interface emulator
• Protect against inappropriate changes with the Project Change Validator tool

• Device and operation according to the standard IEC 60811-504
• The complete set consists of various winding spindles and cable guides for various diameters: Winding spindles: 10, 12, 14.5, 18, 22, 27, 33.5, 41, 50 mm | 0.4, 0.5, 0.57, 0.7, 0.86, 1.06, 1.32, 1.61, 1.96 Inch outer diameter; Cable guides: 3.2, 4, 5, 6.2, 7.7, 9.6, 12, 15 mm | 0.12, 0.15, 0.19, 0.24, 0.30, 0.38, 0.5, 0.59 Inch inner diameter
• The winding spindles and cable guides interlock easily and are easily fastened
• Maneuver Ratio: 5/1: 5x Crank rotation = 1x spindle rotation
• Spindle/Guide diameter ratio: 0.8x sample diameter
• Device suitable for positioning in a cold chamber - Product No.: 402.0020.04

• Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
• Guarantees fully-guarded measurements to fA and fF levels
• Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
• Allows probing of different pad materials and sizes
• Fast replacement of worn probes without the need for tools

• Measuring device to detect the twist/lay/pitch length of sheathed cables
• Measurements according to the standards LV212 und LV122
• The twist length of the sample is measured without removing the sheath → this ensures a precise measurement
• Traditional methods manipulate the sample (cable stripping or unwinding of conductors) → a precise measurement is not possible anymore
• Via a PC connection, the measuring results can directly be exported
• Fully automatic: By clicking one button, the measuring sensor automatically moves along the sample

Flexibility

• Different substrate carriers for wafers up to 200 mm or single dies
• Probe cards and/or up to eight positioners
• Optional thermal chuck (-60°C to 300°C) and pressure regulation
• Accessories available, such as black bodies and optical motion analysis tools
• Optional upgrade for 300 mm wafer
• Designed for industrial environments
• Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
• Ideal for small structures

See "Specifications & Details" tab for more key features