VTI Instruments - APEX Turbine Data System (DS)
The APEX Turbine Data System (DS) is the next generation of data acquisition, control, setup, and online analysis. It reliably acquires time-synchronized data from a network of digitizers, regardless of sample rate or sensor type.
Setup & Control
- Very high reliability – Unit Under Test doesn’t wait for data system
- Can use same software with different hardware
- Operators only need to learn one interface
- Pick whatever hardware is best for the test
- Completely open architecture
- Data format non-proprietary, public
- Seamless integration of dynamic data and Static Data Acquitsition System data
- Used extensively by most major OEM’s
Online Data Analysis
- Complete online, real time engineering analysis of data saves time and money
- Improve Unit Under Test safety
- Eliminate useless testing
- Accelerate offline analysis
- Use multiple monitoring stations/engineers to distribute analysis workload
- Sophisticated use of frequency domain limits provides advanced online analysis capability
- FREE Data Viewer
More Product Information
- Comprehensive Test Solutions - Our CTS 4.0 Series offers complete test solutions for emissions and immunity compliance testing of AC and DC power products, ensuring your products are ready for global markets.
- Single & Three Phase Operation - Offers flexibility
- Direct PC Bus Access - Provides high sampling rate and resolution for accurate measurements and high-speed data transfers
- PC-Based Harmonic & Flicker Testing - Provides real-time full-color data display updates and continuous PASS/FAIL monitoring
- Supports Global Standards - Supports European and Japanese standards
- Easy To Use Interface - Provides IEC test setup, data analysis, display, MS Word test reports, and data files generated in MS Excel format
- High Resolution - Data storage to disk for post-acquisition analysis and reporting
- Single Step - Single Step and Fast Forward replay of recorded test data at 200 mSec
The SMX-6xxx product family includes the SMX-6101 (pictured), SMX-6103, SMX-6106, SMX-6111, SMX-6115, SMX-6116, and SMX-6144.
- High Current - 300 mA Sink
- High Density - 64 Channels / Card
- Isolation - 1000 V
- Multiple Digital Logic Levels - LV TTL - TTL - 60 V Max, User Defined
- Flexible Configurations - Dedicated Input - Dedicated Output - Eight, 8-Bit Ports
- Flexible Software - Embedded Soft Front Panel - Common IVI Software Drivers
- Flexible bench configuration empowers users to easily set up instruments and DUTs to match any measurement workflow.
- Automated, multi-instrument calibration workflows empower users to achieve high accuracy results across diverse setups with minimal user intervention.
- Built-in system calibration verification instills confidence in measurement accuracy before data collection begins.
- Comprehensive small-signal, large-signal, and pulsed testing captures real-world device behavior for reliable design and modeling.
- Powerful visualization and analytics suite empowers users to quickly interpret results, extract models, and drive faster design decisions.
Multiplexer switch modules up to 1000VDC in a 1, 2 or 4 wire configurations.
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
- High power density in 4U/14U chassis up to 36 kVA.
- Intuitive touch panel control.
- iX2™ current doubling technology.
- Multi-language user interface for global operation.
- Auto paralleling for higher power.
- Combine units for multi-phase configurations
- Complete optional avionic test suites.
- ATE version available
- High-density, compact (1U) precision data acquisition instruments
- LXI™ LAN connectivity
- Fully integrated signal conditioning maximizes performance and accuracy
- Easily integrate thermocouples, voltages, RTDs, thermistors, frequency, strain and pressure on an per-channel basis
- Distributed, synchronized measurements over the wire
- Scalable architecture easily expands from tens to thousands of channels
- DC version available for test cells requiring closer proximity to test article
- End-to-end self-calibration ensures optimum runtime performance
- Web-based access for monitoring and control
- Exlab turnkey software for simplified setup, control and data display
- 4-Channel, 204.8 Ksa/s per channel, 24-Bit DACs
- -115 dB spurious free dynamic range
- Integrated 2-Channel 64-bit tachometer
- Integrated 4-Channel DIO
- Tight synchronization with DSA analyzers
- Ideal for rotational measurement, and stimulus-response applications such as vibration test
- Output modes including Sine, Burst Sine, Chirp, Burst-random and continuous random
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