support of many programmable devices, e.g. eMMC, NOR and NAND, CPLDs, FPGAs programming interfaces e.g. SPI, SWD, I2C, JTAG, UART, DAP support of data streaming for flexible programming data handling real parallel high-speed programming FlashFOX® master unit with up to 8 high-speed programming channels to the POD very compact POD unit for easy integration into ATE systems simple adaptation to existing systems on the hardware side API available for easy software integration in existing systems suitable for industrial use in 24/7 operation anti-piracy protection (security)

a fully integrated software platform maximum productivity due to intelligent tools maximum safety for the test vectors extended test depth for non-scannable circuitry combination of state-of-the-art test and programming strategies deep interaction and integration capability for other ATEs maximum modularity and scalability personalisation of the entire system (myCASCON) support during the entire product life cycle a portfolio containing more than 100 software tools and edition

JULIET is a professional JTAG / Boundary Scan Tester suitable for production. It combines the complete system electronics together with the adaptation of the UUT via an exchangeable adaptor in a compact system. The JULIET testers are based on standard components like SYSTEM CASCON™, SCANBOOSTER™, and SCANFLEX® II, hence they are compatible to systems already used in development, and flexibly upgradable. A total of six different JULIET versions cover all possible production applications, from the simple test execution to the complete repair station with graphical failure visualisation, and make the system ideal for fast prototyping and low volume production.

RAPIDO is a multi-site programmer for inline programming and testing. Are you developing your next electronic assembly and are dealing with "test and programming" concerns? Your complex boards feature difficult to contact fine-pitch components (e.g. BGA, FPGA) while test and programming still must be efficient? RAPIDO is an outstanding, "lightning-fast" solution for programming and test using embedded system access (ESA) technologies. Special mechanics ensure precise board contacting from both sides, even for high probe counts. The system can easily be integrated into a production line, keeping up even with high-volume manufacturing cycle times.

SCANBOOSTER II controller for Embedded Testing and Programming high flexibility through multifunctional I/O channels for mixed-signal tests ·  modularity and scalability due to configurable TAP Interface Cards integrated compact unit controllable via USB 2.0 and GBit-LAN PicoTAP ATE Controller for embedded testing and programming Low-cost module with high performance and multifunctional architecture available in a housing or as a PCBA for spacesaving installation in the test system integrated compact unit controllable via USB 2.0

SCANFLEX II CUBE is the new generation modular JTAG/Boundary Scan controller. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform. 8 independent and parallel Test Access Ports (TAP) for up to 100 MHz Synchronized operation of embedded test, debugging and programming Programmable multifunctional 64 channel I/O signal unit Programmable TAP protocols for numerous processor debug interfaces Support of up to 31 parallel controlled SCANFLEX I/O modules Controllable via USB 3.0 and GBit LAN

Multi Tester with 16AMP CDN EFT/Burst 5kV IEC 61000-4-4 Surge, Combination Wave 7kV IEC 61000-4-5 Surge Magnetic field IEC 61000-4-9 (MSURGE-A loop antenna required) Ring Wave, 7kV IEC 61000-4-12 & ANSI Telicomm Wave, 7kV IEC 61000-4-5 & ITU AC Dips/Drops IEC 61000-4-11 (DIP 116 dips transformer required) DC Dips/Drops IEC 61000-4-29 (2x DC supplies required)

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The EMC test system is designed for testing electromagnetic immunity of the electrical installation of vehicles and components against supply line transients. EMC - Test Equipment for the electrical installation of vehicles. Pulse #1 1-5/2000us, 600 V #1 1-5/1000us, 600 V Pulse #2a 1 / 50us, 600 V Pulse #3 5/100 ns, 800 V

See "Specifications & Details" tab for more information

See "Specifications & Details" tab for more information

See "Specifications & Details" tab for more information