• 2" (32 mm) max. Sensor size
• 3 focal lengths: 35 mm, 50 mm and 75 mm
• Very high resolution down to 2.4µm pixel size
• Initial aperture: F2.8
• M42 lens and TFL-Mount lens available
• Covering a wide working distance range

WaveMaster 8000HD is the only high speed oscilloscope designed for all stages of product development, whether first-silicon characterization, link validation over channels, or debugging across the entire the protocol stack. No other high speed oscilloscope supports more engineering tasks with more unique tools.

• Exceptional signal characterization performance
• Unrivaled validation and debug capabilities
• Comprehensive serial data expertise

The SMX-6xxx product family includes the SMX-6101 (pictured), SMX-6103, SMX-6106, SMX-6111, SMX-6115, SMX-6116, and SMX-6144.

• Wire-speed traffic generation and analysis
• High precision solution for chassis time synchronization
• Used for OWL measurements, synchronized traffic start and timestamping
• Can use any combination of NTP, PTP or RFC 868 TIME
• Legacy Xena testers can be retro-fitted with XenaTimeSynch (GPS requires factory refit)
• Compatible with Xena1564 (ITU-T Y.1564) test methodology

Specific application to Automotive. 

The Gold standard for EMC Anechoic Chambers, this 10 meter test range ensures EMC compliance testing Emission and Immunity testing and is compliant to ANSI C63.4/CISPR-16-1-4 with a Test Volume diameter of 4 meters or greater. The most versatile and accurate of EMC test chambers. Ferrite tiles and hybrid pyramidal absorbers allow for high accuracy and performance while meeting compact space requirements.

High voltage differential probes provide high CMRR over a broad frequency range (up to 400 MHz) to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.

• Available in 250 MHz and 350 MHz models.
• 2, 4 and 8 channel modes.
• 16-bit vertical resolution.
• Max Sampling rate of 1.2 GS/s.
• Max sinewave frequency of 250 MHz and 350 MHz respectively.

The disruptive and innovative architecture enables to generate/add 8, 16 or 32 channel digital patterns (respectively on 2,4 or 8 analog channels platform) and to operate all models in true arbitrary mode or Direct Digital Synthesis (DDS) mode. Thanks to their high performance, versatile functionality and outstanding usability, the HD T3AWG3K series is the ideal AWG generator for today's and tomorrow's test challenges.

PureLine 3 Technology

• Provides an effectively noise free environment around the device under test (DUT)
• First automated probe station to achieve -190dB spectral noise*
• Up to 32x lower noise (1kHz), for improved device characterization and modelling at the 7/5/2 nm technology nodes targeted for 5G and beyond applications
• Eliminates over 97% of the environmental noise experienced in previous probe systems
• Extensive collection of FormFactor patents, electrical design knowledge, and measurement system IP

Plug In and Go

• World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
• Eliminates all ground-loop induced TestCell noise
• Low field emissions
• Provides fully managed and filtered AC power to the entire system, prober and instruments

See "Specifications & Details" tab for more key features