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FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
- Coaxial and triaxial measurements up to 10,000 V
- High-quality construction with low-noise electrical performance
- Replaceable probe tips in a variety of tip sizes
- Temperature range of of -60°C to 300°C
- Triaxial measurement ensures a much better understanding of device leakage in the off state
- Highly reliable, stable and repeatable measurements
- Integrally designed as part of a complete measurement solution
To ensure precision measurements of today’s high-voltage devices, FormFactor’s High-Voltage Probes (HVP) provide increased isolation resistance and dielectric strength by incorporating advanced internal isolation materials, as well as custom cabling and connectors.
When used with a , the HVP assures low-noise electrical performance and full triaxial capability at high voltage without any breakdowns.
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The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
Our EuroBrite™ lineup provides industry leading technology with value pricing for an unmatched performance / price ratio:
- Complete built-in control for continuous and strobe modes.
- Adaptive Power™, a feature of the EuroBrite™ lighting controller, utilizes an onboard thermistor to maximize light output in continuous mode.
- Adaptive Overdrive,™ another feature of the EuroBrite™ lighting controller, provides a maximal output pulse in strobe mode regardless of the exposure period.
- IP67 sealed enclosure suitable for washdown environments.
- Rugged construction that has been tested to withstand over 1000lb.
- Industrial grade LEDs providing high-intensity illumination of 45klux (working distance of 200mm).
- Daisy chain up to 4 for a combined length of 48”.
- Guaranteed performance to 43.5 GHz with Extended K™ ports
- High output power allows measurement of high attenuation devices
- Wide dynamic range enables measurement of very low reflection artifacts
- Excellent corrected directivity minimizes measurement uncertainty
- SmartCal™ auto calibration unit reduces calibration and setup time
- Time domain with time gating option grants easier and faster fault identification
- Modern LAN interface for remote control is faster than GPIB
- A common GUI and SCPI interface within the ShockLine family
- Bias tee option simplifies test setups where the DUT needs DC biasing
- Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction
- E-Band VNA
- Extended frequency range covering E-band and major parts of V band
- Fully assembled test system eliminates setup errors and increases reliability
- Tethered modules connect directly to the DUT increasing measurement stability
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
The LSProbe 1.2 Variant E Field Probe is a high-speed, high-accuracy, and high-dynamic range electric-Field probe.
- Its standard frequency range of 10 kHz – 8.2 GHz. 1,000 V/m
- Best-in-class compensation of linearity, frequency, and temperature guarantees accurate measurements from less than 0.1 to at least 1,000 V/m.
- A dynamic range of 100 dB is achieved for many frequencies, enabling Field measurements at more than 10,000 V/m.
- Customized high Field-strength „X“-variants, supporting up to 30,000 V/m and a damage level of 100,000 V/m, are available upon request.
AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.
Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.
From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.
Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.
- Industrial standard
- Repeatable product performance due to automated production processes
- Highest reproducibility of beam quality
- Optical output power up to 200 mW
- Wavelengths from 405 – 830 nm
- Manually focusable (ZXS20)
- TTL modulation up to 150 kHz
- Analog intensity control
- Full-radius, nickel-plated tungsten needles
- Power bypass inductance: 16 nH
- Supports collinear and non-standard needle configurations
- Support up to a maximum of 12 ceramic blades DC needles / contacts
- Ideal for probing the entire circuit for functional test
- DC probes can provide power or slow logic to circuit under test
- Easy to Use
- No need to break the circuit or insert a shunt
- Small form factors for use on crowded boards
- Variety of Applications
- Bandwidths up to 100 MHz
- Peak currents up to 700 A
- Sensitivities down to 1mA/div
- High Precision Measurements
- Low frequency accuracy of 1%
- Integrated autozero capability
- Fully Integrated with Teledyne LeCroy Oscilloscope
- No additonal hardware is required
- Power is supplied from oscilloscope ProBus connection
- Automatic display of waveforms in Amps and calculated power traces scaled correctly in Watts
- Degauss and Autozero directly from oscilloscope user interface
- DCS025 Deskew Calibration Source
- Provides ability to precisely deskew most voltage probes along with 30, 150 and 500A current probes
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
