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FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
- Coaxial and triaxial measurements up to 10,000 V
- High-quality construction with low-noise electrical performance
- Replaceable probe tips in a variety of tip sizes
- Temperature range of of -60°C to 300°C
- Triaxial measurement ensures a much better understanding of device leakage in the off state
- Highly reliable, stable and repeatable measurements
- Integrally designed as part of a complete measurement solution
To ensure precision measurements of today’s high-voltage devices, FormFactor’s High-Voltage Probes (HVP) provide increased isolation resistance and dielectric strength by incorporating advanced internal isolation materials, as well as custom cabling and connectors.
When used with a , the HVP assures low-noise electrical performance and full triaxial capability at high voltage without any breakdowns.
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- Small: complete, compact system with embedded closed-loop controls. Less than half the size and one-fourth the weight of comparable systems.
- NO external control board is needed.
- Precise: 0.5μm position resolution with six millimeters of travel.
- Low voltage, low power use: runs on 3.3V input, holds position with power off.
- Simple system integration: accepts high-level motion commands DIRECTLY from your system processor, over standard serial interface (I2C or SPI).
- Flexible system, fast time to market: the M3 platform is designed for rapid customization. Modules are configurable for single- or multi-axis motion and travel up to 20 mm.
- The SL162 is characterized as a High Intensity Spot/Coaxial Light and is designed primarily to replace fiber optic light sources in coaxial lensing applications.
- Optional couplers are available for use with Dolan-Jenner, Fostec, and Moritex fiber bundles.
- The spot light is designed with sufficient thermal management to provide 33kLux at a working distance of 4” (100mm).
- A very wide range of wavelengths from UV to IR are available.
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Coaxial air lines are air-dielectric transmission lines with highly accurate dimensions that can be used as fundamental impedance standards in measurement and calibration applications, and may also be used to establish reference positions for measurements.
Bead supported air lines offer greater convenience and easier connections (the center conductor is automatically aligned by the dielectric bead for easy connection); beadless air lines offer better impedance and electrical length accuracies, as well as lower VSWR (the center conductor floats free in the air line body, and the male connector nut is retractable to facilitate insertion of the center conductor contact before the thread- on connection tightened.
- 3000 VA to 15000 VA of AC Output Power
- Combines AC/DC source and power analyzer
- Harmonic analysis of Voltage and Current
- Programmable Impedance
- AC, DC and AC+DC Output Modes
- Multiple Chassis Configurations
- Powerful output transient generation
- High Crest Factor Capability
- Arbitrary waveform generation
- IEC 61000-3-2 and IEC 61000-3-3
MP1900A series is an 8-slot modular, high-performance BERT supporting all-in-one Physical layer measurements of both high-speed network interfaces as NRZ and PAM4, and PCI Express/USB, bus interfaces
- Highest resolution – 12 bits all the time
- More channels, flexibility – 8 analog and 16 digital channels
- Longest Memory – 5 Gpt records with simple navigation – no compromise
- View 16 channels on one display with OscilloSYNC™
- Powerful, deep toolbox enables and simplifies complex analysis
- MAUI with OneTouch user interface for intuitive and efficient operation
- Zone Trigger – Simple Triggering for Complex Signals
- Low noise
- Excellent line⁄load regulation
- Coarse and fine voltage controls
- Constant voltage or constant current operation with automatic crossover and mode indication
- Individual ON⁄Off switch per output (not including fixed output)
- Switchable 3.3V⁄5V output on triple output model
- Switchable remote sense (XPH 1810 and XPH 4210 models)
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
- Bandwidth models from 8 GHz to 30 GHz
- Low loading and high impedance for minimal signal disturbance
- Wide variety of tips:
- Standard and high-sensitivity 30 GHz solder-in tips
- High-temperature solder-in tip with 1-meter lead
- QuickLink adapter for mixed-signal probing
- Handheld browser tip
- Tips for direct oscilloscope connection to CrossSync PHY protocol analyzer interposers
- Built-in tip identification for simple setup and precise signal reproduction
- Ideal for debug and validation of:
- PCIe 1.0 to 6.0
- DDR3/LPDDR3
- DDR4/LPDDR4/LPDDR4X
- DDR5
- Other high-speed serial interfaces
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
