FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
- Coaxial and triaxial measurements up to 10,000 V
 - High-quality construction with low-noise electrical performance
 - Replaceable probe tips in a variety of tip sizes
 - Temperature range of of -60°C to 300°C
 - Triaxial measurement ensures a much better understanding of device leakage in the off state
 - Highly reliable, stable and repeatable measurements
 - Integrally designed as part of a complete measurement solution
 
To ensure precision measurements of today’s high-voltage devices, FormFactor’s High-Voltage Probes (HVP) provide increased isolation resistance and dielectric strength by incorporating advanced internal isolation materials, as well as custom cabling and connectors.
When used with a , the HVP assures low-noise electrical performance and full triaxial capability at high voltage without any breakdowns.
More Product Information
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Smear reduction
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24 dB)
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Auto exposure (129 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets
 
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Fast GigE Vision InGaAs SWIR camera
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VGA resolution
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Power over Ethernet
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Compact industrial design, no fan
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Up to 301 fps at full resolution
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GigE Vision interface with Power over Ethernet
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor cooling, no fan
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Extended operating temperature range
 
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Built for extreme environments, our IP69K certified lights are specifically engineered to withstand everything from prolonged liquid immersion to high-pressure steam cleaning.
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Crevice-free design with smooth-bodied surfaces to diminish the chance of material buildup while improving its ease of cleaning.
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Proprietary nickel finish for vastly improved corrosion protection and engineered with thermal management in mind – housing is 11X more thermally conductive than stainless steel.
 
- Up to 65 GHz
 - Up to 80 Channels @ 36 GHz
 - Up to 160 GS/s
 - Up to 512 Mpts/Ch
 - 50 fs rms Sample Clock (Intrinsic) Jitter
 - Jitter Between All Channels of <130 fs rms
 
- 2" (32 mm) max. Sensor size
 - 3 focal lengths: 35 mm, 50 mm and 75 mm
 - Very high resolution down to 2.4µm pixel size
 - Initial aperture: F2.8
 - M42 lens and TFL-Mount lens available
 - Covering a wide working distance range
 
- Accommodates a combination of up to four Cascade Microtech probes
 - Configurable for mixed-signal RF/mmW testing
 - Quick and easy repairs to be performed in the field, by simply replacing individual probes
 - Adaptable to new device layouts by exchanging individual probes
 
- High Power Density (2 VA/cubic inch)
 - Single or multi-phase output
 - Parallel operation
 - 4.8 Crest factor
 - Digital control loop technology
 - ≥0.95 PFC
 - Brown-out simulation
 - AC 875 VA
 - 45 to 5000 Hz
 - Universal AC/DC input via mainframe
 - User configurable
 - Simple integration
 
Flexibility
- Different substrate carriers for wafers up to 150 mm or single dies
 - Up to six positioners
 - Optional thermal chuck (-60°C to 300°C) and pressure regulation
 - Probing with an open chamber lid possible under atmospheric condition
 - Specially designed for laboratory environments
 - Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
 
See "Specifications & Details" tab for more key features
Linea line scan cameras deliver the performance and features usually found in high-end cameras at an attractive price point. Based on advanced CMOS line scan technology, Linea GigE cameras have a 2k or 4k single line 7.04 µm x 7.04 µm pixel array. With excellent sensitivity and speed, Linea surpasses the requirements of demanding applications —such as materials grading and inspection, transportation safety, and general purpose machine vision.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement