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FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
- Coaxial and triaxial measurements up to 10,000 V
- High-quality construction with low-noise electrical performance
- Replaceable probe tips in a variety of tip sizes
- Temperature range of of -60°C to 300°C
- Triaxial measurement ensures a much better understanding of device leakage in the off state
- Highly reliable, stable and repeatable measurements
- Integrally designed as part of a complete measurement solution
To ensure precision measurements of today’s high-voltage devices, FormFactor’s High-Voltage Probes (HVP) provide increased isolation resistance and dielectric strength by incorporating advanced internal isolation materials, as well as custom cabling and connectors.
When used with a , the HVP assures low-noise electrical performance and full triaxial capability at high voltage without any breakdowns.
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Ultraminiature reed relays are engineered for high-density, low-profile applications where space and performance are critical. With package heights as low as 3.4 mm and footprints under 8 mm, these instrumentation-grade relays are among the smallest in the industry. Ideal for tightly stacked matrices and compact PCB layouts, they offer high insulation resistance, low contact resistance, and reliable switching for billions of operations.
- S-parameters DC to 40 GHz, single-ended and mixed-mode
- Impedance Profile with <1 mm resolution, differential and common mode
- Built-in automatic calibration, no manual setup required
- TDR-powered impedance profiling enables precise de-embedding
- Advanced de-embedding including Time Gating and 2Xthru
- Emulate eye diagrams with equalization and advanced jitter analysis
- Complete NRZ and PAM analysis suite for high-speed serial data
- All-in-one solution for testing, compliance, and diagnostics.
- Combine up to 16 SPDT or 8 multiport, high-performance relays in a 2U footprint
- Latching/Terminated options (EX7204L)
- LXI/LAN and USB command and control options
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI trigger event implementation provides seamless test synchronization with external devices
- Store up to 128 relay configurations for quick recall, including automatic power-up state
- Tests and validates performance directly on silicon without post-dicing packaging
- Dramatically reduces time to data and shortens development cycles
- Enables high scalability for high volume manufacturing
- Offers flexibility in chip design with full grid probing
- Highest resolution – 12 bits all the time
- More capability – integrates multiple instruments into one
- Comprehensive probe support – supports over 30 probes in 9 categories
- MAUI with OneTouch user interface for intuitive and efficient operation
Mechanic high resistance decade with RS232 remote control for voltages up to 5 kV. Internal battery for up to 3 hours of on site calibration.
- 12 GΩ and 5 kVdc limits
- Voltage limit indication
- Battery-powered
- Remote control via RS232 bus
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.
- Modular Timing System
- Flexible
- Upgradeable
- Redundant
- Hot Swappable Modules
- High Accuracy
- Network-Centric
- Rugged
- Environmentally Qualified
- Automatic Propagation Delay Compensation
- Flexible input reference – GPS, Have Quick, IRIG B
- Choice of Series resistance or Termination (signal line to ground)
- Use of High Performance RF Resistors
- Choice of Resistor values available
- Choice of body styles, Infinity, ACP or FPC
- Can help to stabilize oscillations in high-gain devices
- Impedance match to low dynamic resistance laser diodes
- Custom configured for your application
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
