You design the future. We help you make it happen.
FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
- Coaxial and triaxial measurements up to 10,000 V
- High-quality construction with low-noise electrical performance
- Replaceable probe tips in a variety of tip sizes
- Temperature range of of -60°C to 300°C
- Triaxial measurement ensures a much better understanding of device leakage in the off state
- Highly reliable, stable and repeatable measurements
- Integrally designed as part of a complete measurement solution
To ensure precision measurements of today’s high-voltage devices, FormFactor’s High-Voltage Probes (HVP) provide increased isolation resistance and dielectric strength by incorporating advanced internal isolation materials, as well as custom cabling and connectors.
When used with a , the HVP assures low-noise electrical performance and full triaxial capability at high voltage without any breakdowns.
More Product Information
HYPERLABS offers high-performance, ultra-broadband DC Feeders with low insertion loss throughout the specified bandwidth range.
- Ideal for multiport RF/Microwave and high-speed digital signal testing
- Mix DC and RF/Microwave signals on one probe
- Long lifetime – typically over one million (1,000,000) touchdowns
- Excellent performance in temperatures ranging from 10 K to 200°C
- Probe on any pad material with no damage
A Semi Anechoic EMC Chamber with 3-meter test range ensuring EMC compliance for Emission and Immunity testing. Ferrite and hybrid pyramidal EMC absorbers are combined in a unique pattern within a SmartShield high performance chamber. Operating at a 3m test distance, this chamber is compliant to ANSI C63.4/CISPR-16-1-4 with a Test Volume diameter of 1 to 2 meters.
- The Direct PC bus access data acquisition system provides the required sampling rate and resolution to meet IEC 61000-4-7 measurement requirements and supports high-speed data transfers.
- PC-based Harmonic and Flicker test software provides real-time full-color data display updates and continuous PASS/FAIL monitoring.
- Automatic calculation of the maximum permissible system impedance Zsys, using the Zref and measured Flicker parameters, as required per EN/IEC 61000-3-11.
- Intuitive operating software provides IEC test setup, data analysis, display, with test reports in and MS Word format.
- High resolution, no gap acquisition data storage to ensure that all data can be streamed to disk (in ASCII format if needed) for later review and replay of the actual test.
- Single Step and Fast playback mode of test results.
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Use with liquid nitrogen or helium, depending on the target temperature
- Accessories available, such as black bodies and optical motion analysis tools
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
See "Specifications & Details" tab for more key features
Our reverberation chamber is particularly suited for immunity testing for EMC measurement and special applications for very high-field strength applications (200V/m - 7000V/m). The paddle system ensures that the widest range of frequencies and particularly low frequency performance is maximized. This system meets testing requirements of the IEC61000-4-21 EMC testing specification.
-
Replace costly and inflexible test fixtures with easy-to-use probe tips
-
Long lifetime – typically over 1,000,000 contacts
-
GS/SG footprint up to 4 GHz and GSG up to 20 GHz
-
High-power RF test: up to 30 Watts
-
Test at temperatures from -60°C to 200°C
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz
- Extremely high resolution down to 3.5µm pixel size
- Image circle: 62.5 mm - 82 mm
- Optimized for specific magnifications
- 5 magnifications available: 2.6x - 5.2x
- Versions with beamsplitter available
- Best azimuth marking
- V-Mount for easy installation
FormFactor, Inc.
Website
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
