FormFactor - HPD JDry-500 - Cryogen-free Dilution Refrigerator
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
FormFactor’s JDry cryogen-free dilution refrigerators enable easy and cost-effective cooling to temperatures below 10 mK. The JDry models have been optimized for quantum computing applications and can accommodate up to 270 semirigid cables. General-purpose configurations and astronomy/detector cooling are also provided.
The JDry cryogen-free dilution refrigerator series includes multiple standard models. All are available with easy push-button cooling using the robust and fully-automated NI LabVIEW™-based “JACoB” gas-handling system (GHS).
The JDry-500 model is fitted with a cold-plate of 508 mm (20″) diameter, and provides a cooling power of more than 450 µW at 100 mK.
Document
More Product Information
-
DC-40 GHz bandwidth
-
10 ps rise time
-
Low insertion and return loss
-
2 mils of tip-to-tip compliance
-
High probing angle and clearance
-
Infinity Probe: best for Al (Si)
-
ACP Probe: best for AU (III-Vs)
-
|Z| Probe: robust solution (long lifetime)
-
RF chuck ±3 μm surface planarity
-
Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
-
Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
-
Automated calibration monitoring
See more Key Features on Specifications & Details tab
-
Replace costly and inflexible test fixtures with easy-to-use probe tips
-
Long lifetime – typically over 1,000,000 contacts
-
GS/SG footprint up to 4 GHz and GSG up to 20 GHz
-
High-power RF test: up to 30 Watts
-
Test at temperatures from -60°C to 200°C
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Thermal range: -60˚C to 300˚C available
-
Upgrade path to meet your future needs
-
Stable and repeatable measurements over a wide thermal range
-
Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
-
Advanced EMI-shielding with PureLine with AttoGuard technologies
-
Best solution for low-noise and 1/f measurements
-
Minimize AC and spectral noise
-
Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
-
Locking roll-out stage
-
Innovative microscope remote control
-
Intuitive ergonomic stage controls
-
Quick, safe, and comfortable wafer access
-
Easy on-wafer navigation
-
Fast setup and test data gathering
-
Dedicated Velox version for manual probe stations
-
AugmentedAlign tool with on screen markers for improved RF measurement accuracy
-
Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
-
Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
-
LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
-
Automatic load inductance compensation function ensures the most repeatable calibrations
-
Easy to use Probe to ISS/CSR matching tool
-
Additional remoting methods
-
Interface with Velox™ over LAN
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements
-
Load-lock chamber: Cycle devices 10X faster in a cryogenic environment
-
High-density electrical interface at cryogenic temperatures: More pins on the device enables more test structures to be probed with a single cooldown
-
Base temperature of < 2K or < 4K with high cooling power: Test devices at the temperatures that matter most for pre- screening and evaluating device performance
-
Low vibration: Stable contact with the device under test and enables low noise measurements
-
Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
-
Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
-
Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
-
Calibration Monitor and Re-calibration – System will
continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
-
Fully isolated experiment space for true 4K temperatures during probing
-
Cryogenic positioners to provide large travel ranges without warming up the device
-
Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
-
A soft vacuum bellows provides a compliant mounting interface for the cryocooler
-
Quick release vacuum feedthroughs for easy configurability
-
A large rectangular port for high signal capacity
See more Key Features in Specifications & Details tab
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
