Montena Technology - 10kHz to 30MHz Field Generator / Stripline
- 10kHz to 30MHz
- Adjustable height 1.5 to 3.5m Strip-line
- Full vehicle testing
- Mil-STD-464 & ISO 11451-2
The E/H field generator is specially designed for the immunity test to electromagnetic fields on medium-sized devices. It can also be used for specific tests according to the MIL-Standards. The main advantage of this line is that the equipment under test can easily be successively tested in both polarisations. The height of the structure can be adjusted to optimize the field intensity. The line is electrically symmetrical and the impedance is adapted through transformers on both sides. The parallel plate line can also be used for immunity tests on automotive devices according to the European directive 2004/104/EC or to ISO 11451-2 and on broadcast receivers and associated equipment according to EN 55020.It consists of a structure to be placed in the chamber or in an open area test site. The 2 slopes of the structure and the line are made with wires. The structure can be dismounted easily in order to carry out other tests in the chamber. Some precaution must be taken if the field generator is installed close to metallic structures in order to avoid resonances.
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Specification |
GENE-E-30-3K |
|---|---|
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Height under the septum |
Adjustable, 1.5 - 3.5 m |
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Rectangular area under the septum (L x W) |
6.0 x 3.5m |
|
Frequency range (± 1 dB) (in the lowest position) |
10kHz to 30MHz |
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Maximum input power |
3kW long term |
|
E-field for 1 kW |
See Figures 1 and 2 |
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Line impedance (V / H) |
100 ohm/200 ohm |
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Input impedance |
50 ohm |
|
Wave impedance |
377 ohm |
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Connector type |
50 ohm 7/16 |
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Mech. dimensions (L x W x H) |
16.3 x 4.2 x 4.2 m |
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Weight |
280 kg |
Typical performances
Theoretical electric field for an input power of 1 kW and different septum heights (1.5, 2.5 and 3.5 m) for both vertical and horizontal E-field orientations. The losses of the transformers and the effect of the chamber are neglected.
Dimensions
More Product Information
PureLine 3 Technology
- Provides an effectively noise free environment around the device under test (DUT)
- First automated probe station to achieve -190dB spectral noise*
- Up to 32x lower noise (1kHz), for improved device characterization and modelling at the 7/5/2 nm technology nodes targeted for 5G and beyond applications
- Eliminates over 97% of the environmental noise experienced in previous probe systems
- Extensive collection of FormFactor patents, electrical design knowledge, and measurement system IP
Plug In and Go
- World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
- Eliminates all ground-loop induced TestCell noise
- Low field emissions
- Provides fully managed and filtered AC power to the entire system, prober and instruments
See "Specifications & Details" tab for more key features
- First portable spectrum analyzer to provide continuous frequency coverage to 170 GHz
- Broadband mmWave capabilities for radio astronomy, automotive radar, wireless backhaul, 802.11ad, satcom, and more
- Ultraportable form factor enables measurements right at the device under test
- Measure: channel power, adjacent channel power, occupied bandwidth
- Patented NLTL technology provides > 100 dB dynamic range
- -141/-136/-129/-122 dBm DANL to 90/110/145/170 GHz ( Spectrum Master MS2762A)
- Up to 6 traces, 3 trace detectors, and 12 markers
- Standard three-year warranty
- Vector Network Analyzer Frequency Range from 10 MHz up to 3.2 GHz
- Spectrum Analyzer Frequency Range from 9 kHz up to 3.2 GHz
- -156 dBm/Hz Displayed Average Noise Level (Typ.)
- -98 dBc/Hz @10 kHz Offset Phase Noise (1 GHz, Typ.)
- Total Amplitude Accuracy < 1.2 dB
- 1 Hz Minimum Resolution Bandwidth (RBW)
- All-Digital IF Technology
- Standard Preamplifier
- Distance to fault capability using VNA time domain analysis
- Up to 1.5 GHz Tracking Generator Kit
- Built-in Advanced Measurement capability (CHP, ACPR, OBW, CNR, TOI, etc)
- 10.1 lnch WVGA (1024 x 600) Display
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IMX304 CMOS sensor
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ALVIUM image processing
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MIPI CSI-2 interface
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Various hardware options
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Monochrome (1800 C-1236m) and color (1800 C-1236c) models
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ALVIUM® Technology for on-board image processing
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MIPI CSI-2 interface with up to 4 lanes
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Platform concept that enables the operation of different Alvium camera models with a common software
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Hirose HR FHH55 FPC connector with minimum space requirements for a compact design
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Precise sensor-to-lens mount alignment
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Standard M3 mounting holes for top and bottom mounting, standard M2 mounting holes for front mounting
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Industrial performance for embedded vision applications
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Easy-to-install driver and code examples
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Die-to-die stepping time of under 100 ms
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Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
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Even extreme variations in height, such as the case with warped wafers, can be compensated
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Interfaces to all major analysis instrumentation, optics software and testers
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Access to top side and bottom side of device under test (DUT)
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Highly accurate light measurement
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Test automation out-of-cassette for 24/7 operation
See more Key Features on Specifications & Details tab
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IMX392 CMOS sensor
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ALVIUM image processing
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USB3 Vision
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Various hardware options
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Monochrome (1800 U-240m) and color (1800 U-240c) models
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ALVIUM® Technology for on-board image processing
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USB3 Vision interface for GenICam SFNC features
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Platform concept that enables the operation of different Alvium camera models with a common software
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Micro-B USB 3.1 Gen 1 connector with screw locks for industrial applications
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Precise sensor-to-lens mount alignment
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Standard M3 mounting holes for top and bottom mounting, standard M2 mounting holes for front mounting
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Industrial performance for both embedded and machine vision applications
The Null Seeker Positioner is used in development and production testing to emulate flight movement of a device encasing null-seeker sensors. Its high motion dynamics and ultra-precise angular positioning, rates, and acceleration allow for accurate evaluations of null seeker technology (ie. RF signal nulls transmitted from directive antennas).
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IMX183 CMOS sensor
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ALVIUM image processing
-
USB3 Vision
-
Various hardware options
-
Monochrome (1800 U-2050m) and color (1800 U-2050c) models
-
ALVIUM® Technology for on-board image processing
-
USB3 Vision interface for GenICam SFNC features
-
Platform concept that enables the operation of different Alvium camera models with a common software
-
Micro-B USB 3.1 Gen 1 connector with screw locks for industrial applications
-
Precise sensor-to-lens mount alignment
-
Standard M3 mounting holes for top and bottom mounting, standard M2 mounting holes for front mounting
-
Industrial performance for both embedded and machine vision applications
- Provides ±0.3 dB (typ.) total level accuracy
- 9 kHz to 3.6 GHz/6 GHz/13.5 GHz/26.5 GHz/43 GHz frequency range
- Various options can be installed
- Spectrum analyzer supporting built-in signal analyzer with FFT technology, vector signal generator, analog signal generator and audio analyzer (options)
- Offers modulation analysis, such as LTE, W-CDMA, WLAN, Vector Modulation and Analog Modulation (with optional software)
- Excellent eco-friendly product with low power consumption of 110 VA min.
Absolute EMC
Absolute EMC LLC is a premier North American provider of electromagnetic compatibility (EMC) expertise and test equipment. They deliver end to end consulting—covering IEC, MIL STD, CISPR, and automotive standards—hands on training for all EMC and RF test instruments, and turnkey test system design and integration. Leveraging decades of experience with every major manufacturer and the latest technologies, they also offer strategic guidance on equipment selection, market trends, and procurement to help you maximize the performance and ROI of your EMC investments.
Contact Details
Absolute EMC LLC
8240 Rugby Road, Manassas Park VA 20111, USA
Phone: 703-774-7505
Email: info@absolute-emc.com
Test & Measurement
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