NEO NXB - 12020B Voltage / Current Breakout Test Box
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On-Off power switch
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20 A Circuit Breaker
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Outlets – (2) Universal
Test Tap:
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3ft.
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(2) fork terminals (current)
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(1) fork terminals (ground)
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(2) Shielded Banana (voltage)
Multiple outlets provide flexibility in connecting equipment under test. Tester pigtail interface simplifies connecting to a variety of voltage/current measuring systems.
| Voltage | Current | Input | Output | Test Output | Switch/Breaker |
| 120/240 | 20A | C14 Inlet | Universal | Pigtail | Yes |
Application
More Product Information
- 24-bit, delta-sigma ADC, simultaneous sampling
- Programmable Sample Rate up to 128kSPS
- Full, Half & Quarter Bridge with 120Ω, 350Ω & 1kΩ bridge completion
- Voltage Excitation: 0.5V to 10V
- Current Excitation: 0.46mA
- 2-Wire & 4-Wire Ohms/RTD
- Bridge Zero Balancing
- Built-In-Self-Test (BIST)
- Strain Lead Wire Calibration
- Shunt Calibration: 50kΩ, 100kΩ & External provided by User
- TEDS Support
- LXI Ethernet Interface
- IEEE-1588 Synchronization
- Power over Ethernet (PoE) or 10–50 V DC input
- Built-in Parallel Data Streaming
- Full-featured Embedded Web Interface
- Compact 1U Half-rack Form Factor
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NEO 941 parts are AS5836 compatible (Clam Shell Clamps not Included)
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NEO 942 parts are AS1653 compatible (Clam Shell Clamps not Included)
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
- Capture from legacy to the latest video sources through support for SD analog to UHD digital formats
- Connect and switch between different video sources via Mini DisplayPort, HD-BNC, HDMI, and custom analog DVI1 connectivity
- Handle multiple video sources with the simultaneous capture of up to eight HD or two UHD streams2
- Optimize video transmission and storage through onboard multi-stream H.264 encoding
- Minimize system footprint by way of a single-slot PCIe card design
- Simplify application development using the Aurora Imaging Library, formerly Matrox Imaging Library (MIL), software development kit (SDK)
- Deploy on a current platform of choice with support for 64-bit Windows® 7/10 and Linux
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15’ Flexible Power Cord
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IEC C13 / C14 Connectors
Test Tap:
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3ft.
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(2) fork terminals (current)
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(1) fork terminals (ground)
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(2) Shielded Banana (voltage)
NEO
NEO offers a line-up of Power measurement breakout boxes designed for use with Yokogawa's precision power analyzers.
Test & Measurement
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