Low insertion loss Low contact resistance Lithographically defined probe tip   Nickel contacts

Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown Even distribution of high current with innovative multi-fingertip design Compatible with TESLA 200/300 mm power device characterization system

Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz Online design configuration tool helps you to specify your probe in minutes All designs are fully quadrant compatible

Supports up to 12 VNA ports than can be mapped to four logical ports for calibration Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations

Full-radius, nickel-plated tungsten needles Power bypass inductance: 16 nH Supports collinear and non-standard needle configurations Support up to a maximum of 12 ceramic blades DC needles / contacts