Fully isolated experiment space for true 4K temperatures during probing Cryogenic positioners to provide large travel ranges without warming up the device Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission

Fully isolated experiment space for true 4K temperatures during probing Cryogenic positioners to provide large travel ranges without warming up the device Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission

Ultra Low Temperature Pulse tube cryocooler for cryogen free 4K temperatures Two stage ADR provides solid state cooling down to 30mK

Ultra Low Temperature Pulse tube cryocooler for cryogen free 4K temperatures He-3 sorption cooler for high power intercept and launch stage for ADR

Customizable sample space to fit the user’s application Long holding time: 100 hours for six (6) STP liter He-3 gas Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line; +/- 0.5 mK at base temperature

Cryogen-free: cooling with two-stage pulse tube refrigerator (PTR) Low vibration Mechanical heat switch Internal charcoal sorption pump

Sample can be loaded or removed when the cryostat is cold High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power) Sample probe and a load-lock with gate valve

Long holding time: 80 hours with 10 STP liter He-3 gas Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line Sample can be loaded or removed when the cryostat is cold Low noise, low vibration

Comprehensive I/O connections: Standard setup of up to 24 RF lines (up to 20 GHz) and 48 DC lines, with extensions to higher I/O connections possible. Non-magnetic construction: Capable of characterizing qubits below 50 mK without magnetic interference when required. Sample size: Proven with chips up to 10×10 mm in size.

Fully isolated experiment space for true 4K temperatures during probing Cryogenic positioners to provide large travel ranges without warming up the device Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission

FormFactor's FRT Metrology engineers designed SurfaceSens technology to achieve superior information about the measured sample and greater insights about product quality. All of our FRT MicroProf® metrology tools can be configured with complementary sensor technologies. In a hybrid analysis process, otherwise inaccessible surface data of wafers or other samples are precisely measured.