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Quick and easy probe tip navigation
Z drive can work in the same range as the chuck
Enables higher separation gap while the DUT stays in focus
Automatically configure and optimize performance
High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
RF bandwidth to 500 MHz
Long probe life: > 250,000 contacts
Beryllium-copper tips for gold pads or tungsten for aluminum pads
DC-40 GHz bandwidth
10 ps rise time
Low insertion and return loss
2 mils of tip-to-tip compliance
Probe station
Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
Choice of probes
Known measurement accuracy traced back to independent standards
Enables wafer probing up to 100 A pulsed and 10A DC
Innovative multi-fingertip design provides even distribution of current
Supports up to 500 V
Replaceable Tungsten probe tips
Coaxial and triaxial measurements up to 10,000 V
High-quality construction with low-noise electrical performance
Replaceable probe tips in a variety of tip sizes
Temperature range of -60°C to 300°C
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application