Products

Displaying 409 - 420 of 1197
Power bypass inductance: 8 nH Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil. Supports collinear and non-standard needle configurations
High-quality construction with low-noise electrical performance Kelvin version for convenient 4-point measurements Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip SSMC 50 connectors
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C Guarantees fully-guarded measurements to fA and fF levels Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
Multi-purpose SIGMA instrument integration kit Shorter cabling and universal chuck connection Triax probe with protected guard Triax design for low-leakage measurements up to 3 kV
Combined eye-pieces and CCD camera mount 3x zoom and quick lens exchange Engraved guides on mmW platen Supports broadband, load pull, coax RF and banded waveguide configuration
Infinity Probe: best for Al (Si) ACP Probe: best for AU (III-Vs) |Z| Probe: robust solution (long lifetime) RF chuck ±3 μm surface planarity
Quick and easy probe tip navigation Z drive can work in the same range as the chuck Enables higher separation gap while the DUT stays in focus Automatically configure and optimize performance
High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz RF bandwidth to 500 MHz Long probe life: > 250,000 contacts Beryllium-copper tips for gold pads or tungsten for aluminum pads
DC-40 GHz bandwidth 10 ps rise time Low insertion and return loss 2 mils of tip-to-tip compliance
Probe station Keysight Streamline Vector Network Analyzer (option up to 53 GHz) Choice of probes Known measurement accuracy traced back to independent standards
Enables wafer probing up to 100 A pulsed and 10A DC Innovative multi-fingertip design provides even distribution of current Supports up to 500 V Replaceable Tungsten probe tips
Coaxial and triaxial measurements up to 10,000 V High-quality construction with low-noise electrical performance Replaceable probe tips in a variety of tip sizes Temperature range of -60°C to 300°C